Artificial superlattice thin films of lead zirconate titanate (PZT) were epitaxially grown on silicon substrates, and the influence of superlattice strain on their piezoelectric properties was investigated. The c-axis oriented PZT superlattice thin film consists of two different PZT layers, Pb(Zr0.65Ti0.35)O3 (PZT-65) and Pb(ZrxTi1−x)O3 (PZT-X: x = X/100 = 0.3–0.9), with a 4 nm period. Satellite peaks were clearly observed in x-ray diffraction patterns, and cross-sectional composition measurements confirmed the superlattice structure with good interfaces, showing an alternate change in Zr and Ti compositions. Ferroelectric properties varied significantly depending on the PZT-X composition, and in particular, the PZT-65/PZT-30 superlattice thin film showed nearly the same ferroelectricity as the tetragonal phase under a large compressive strain of PZT-65 from the PZT-30 layer. For the PZT-65/PZT-X (X = 30–58) superlattice thin films, the PZT-65 layers received a compressive strain, and a relatively large piezoelectric coefficient, which did not depend on the PZT-X composition, was obtained. However, a decrease in piezoelectricity was observed in PZT-65/PZT-X (X = 70 and 90), where the PZT-65 layers experienced tensile strain. This result indicates that the piezoelectric properties of PZT superlattice thin films can be controlled by the interlayer strain.
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