Perfectly (040) oriented Thallium iodide films grown by vacuum thermal evaporation were found to have strain and band gap uncorrelated with their film thicknesses. Band structure of orthorhombic TlI was calculated using Density functional Theory (DFT) with appropriate functional. Elastic constants were calculated for determining the residual stress from strain. Band gaps of films linearly correlate with their residual stress. Experimental stress free direct band gap 2.92 eV determined from band gap-residual stress correlation matches quite closely with calculated 2.88 eV. Pressure coefficient of band gap −1 eV/GPa was determined from the residual stress dependence of band gap.
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