Potassium channels are present in a wide variety of cells and play important roles in cell functions. Although the gating properties of potassium channels have been extensively studied, it is not known whether and how functional states of a channel affect the channel's membrane stability. The human ether-a-go-go-related gene (hERG) encodes the pore-forming subunits of the rapidly activating delayed rectifier potassium channel (IKr) that is important for cardiac repolarization. Here, we demonstrate that a reduction in [K+]o decreased IhERG in a concentration dependent manner, and exposure of cells to 0 mM K+o completely eliminated hERG conductance within 3 min. Notably, the conductance-lost channels due to 0 mM K+ exposure could not be readily reversed to the functional state upon re-exposure to normal MEM (5 mM K+), and they were totally internalized within 4 h under 0 mM K+o culture conditions. The hERG-permeable cations ion Rb+ or Cs+ (5 mM) effectively prevented both hERG conductance loss and internalization caused by 0 mM K+o exposure. Point mutations in hERG pore helix and selectivity filter such as the S624T and F627Y, but not in the S5-P linker and S6 regions, eradicated both 0 mM K+o induced conductance-loss and internalization of hERG channels. Upon exposure to 0 mM K+ medium, WT hERG channels, but not the S624T mutant channels, colocalized with ubiquitin. Overexpression of ubiquitin enhanced degradation of the mature form of WT, but not the S624T mutant hERG channels under 0 mM K+o conditions. Our data demonstrate that the presence of K+o is a prerequisite for hERG channel function, and the K+o-dependent functional state determines the hERG channel membrane stability.