Polyvinyl Acetal Research Articles

Novel and stable carbon black/polyvinyl acetal aerogels efficiently harvesting solar energy for seawater desalination

A novel interfacial solar steam generators (ISSG) was prepared by a porous carbon black/polyvinyl acetal aerogel (CPA) with high light-absorbing hydrophilic properties, to achieve efficient solar-driven water evaporation and seawater desalination. The polyvinyl acetal was produced by the aldol condensation reaction of polyvinyl alcohol(PVA) and glutaraldehyde(GA). It was freeze-dried to create a hydrophilic porous structure that constructs an efficient hydrophilic channel. Carbon black (CB) exhibits high light absorption capabilities. Incident light undergoes multiple scattering within its porous network structure, effectively reducing reflected light energy loss and enabling efficient thermal conversion of sunlight. Benefited from its highly light-absorbing porous hydrophilic structure, CPA-40-3 evaporation rate achieves an impressive 3.23 kg·m−2·h−1 and an evaporation efficiency of 94 % under 1 sun irradiation, without obvious decay even during long-term use. Furthermore, CPA-40-3 demonstrates remarkable salt tolerance, the evaporation rate remains at 2.55 kg·m−2·h−1 although in simulated Dead Sea salt water under 1 sun irradiation. Compared to traditional ISSG, the CPA has advantages such as superior mechanical properties, prevention of surface salt precipitation, faster water supply, and a larger light absorption area. This design had tremendous promise for efficient solar desalination due to its extraordinarily high evaporation performance in high-salinity brine.

Nodule contact path of polyvinyl acetal roller brushes on a rotating plate and its relation to cross contamination

Polyvinyl acetal (PVA) brushes are widely used in semiconductor manufacturing for post-CMP cleaning. However, cross-contamination occasionally occurs due to the re-deposition of contaminants during cleaning. To investigate why contamination patterns in the form of nodules occur even when brushes and surfaces are in relative motion, we study the contact path of roller brush nodules on a rotating plate. We reproduced the relative motion of the roller brush and wafer during cleaning of the 300 mm wafer and visualized the contact between the brush nodule and the surface using a total-reflection optical system. We also observed the nodule deformation with high-speed photography from the side. The experimental results showed that the stamped contacts of the nodule shape coincide with the recontamination points. The contacts occur in a certain area on the wafer where the negative relative velocities reach 200 mm/s, i.e., the wafer is faster than the circumferential velocity of the brush in the same speed direction, and it is not zero relative velocity. We expect that cleaning with avoided stamp contact conditions will prevent recontamination.

Effect of slurry particles on PVA brush contamination during post-CMP cleaning

PVA (polyvinyl acetal) brush scrubbing is a widely used post-CMP cleaning process due to its low cost and high cleaning efficiency. However, during these processes, the PVA brush gets contaminated with abrasive particles that result in wafer cross-contamination and reduced cleaning efficiency. This study investigated the effects of abrasive types such as silica and ceria, the slurry pH, and the scrubbing process parameters on brush contamination. Ceria slurries showed significantly more contamination of brushes compared to silica slurries. The brush contamination increased with a decrease in pH from 7 to 4 due to increased electrostatic attractive forces between the ceria particles and the brush surfaces, although very low brush contamination was observed by the ceria slurries at pH 10 due to a strong electrostatic repulsion. Conversely, very low brush contamination was observed for the silica slurries at all pH values due to the reduced interaction between the particles and the brush surface (electrostatic repulsion). Furthermore, there was no significant effect of gap distance and brush rotation speed on brush contamination. The abrasive concentration and the contamination process time showed a linear relationship as the contamination was significantly increased by increasing the abrasive concentration in slurry and process time. These results indicate that brush contamination is more sensitive to the abrasive nature and concentration, the slurry pH, and the process time than to other parameters.

Effect of Skin Layer on Brush Loading, Cross-Contamination, and Cleaning Performance during Post-CMP Cleaning

The use of polyvinyl acetal (PVA) brushes is one of the most effective and prominent techniques applied for the removal of chemical mechanical planarization (CMP) contaminants. However, the brush can be a source of defects by entrapping the abrasives inside its porous structure during brush scrubbing. In this study, the effect of brush top skin layer was extensively studied on contamination, cross-contamination, and cleaning performance by comparing brushes with and without skin layer. The presence of a dense top skin layer resulted in larger contact areas and high ceria particle adsorption on the skin layer. This leads to higher cross-contamination of the wafers during scrubbing along with high cleaning performances. Conversely, the brushes without skin layer showed lower contamination and negligible cross-contamination with a reduced cleaning performance (removal of ceria particles from oxide surface). Therefore, the role of the brush skin layer is significant and needs to be considered while designing a post-CMP cleaning process.

Study on PVA Brush Loading and Conditioning during Shallow Trench Isolation Post-CMP Cleaning Process

Polyvinyl acetal (PVA) brush cleaning is a widely accepted and efficient cleaning process for removing contaminants of the CMP process during semiconductor processing. However, these contaminants can adhere to the PVA brush, due to its highly hydrophilic and porous nature, and can deteriorate brush performance. This contamination has become a serious problem especially for processing devices smaller than 10 nm. In this work, the effect of cleaning solution pH (2, 7, and 12) was investigated for ceria removal from oxide wafers and subsequent transfer to the PVA brush during scrubbing. A cleaning solution of pH 7 resulted in lower ceria removal efficiency compared to pH 2 and 12. The pH 2 and pH 7 cleaning conditions resulted in high brush loading (pH 2 > pH 7) compared to the pH 12 condition. High brush contamination at pH 7 further resulted in higher cross-contamination, whereas very low cross-contamination was observed at pH 2 and pH 12. For improvement of brush performance and lifetime, the effect of conditioning processes (ultrasonication and scrubbing) was evaluated. Scrubbing in the presence of NH4OH efficiently removed all ceria particles from contaminated brushes. Since the bonding between brush and ceria particles is strong, only a robust physical force combined with a high chemical action can remove ceria particles loaded onto a PVA brush.

Aiding the cleaning of four 19th-century Tsimshian house posts: investigation of museum-applied surface coatings and original polychromy

The collection of the American Museum of Natural History, New York, includes a set of four elaborately painted 19th-century Tsimshian house posts that have been on continuous open display for more than a century. Over time, these objects have accumulated surface grime, and several coating layers applied in undocumented past restoration campaigns, some of which have yellowed with age. The combination of heavy soiling and multiple coatings has obscured the underlying polychromy, shifting the colors of the wood and paints, and yielding improper surface appearances. Further, some of the coatings appeared to have sunk into the media-lean paints, complicating removal. Questions regarding the number, types, and timing of coating applications, as well as the nature of some of the paint below, set the stage for an in-depth technical study aiming to inform the conservation treatment of these poles being undertaken in connection with the renovation of the Northwest Coast Hall at the museum. Microscopic examination of numerous cross sections removed from the four house posts under polarized and ultraviolet (UV) illumination shed light on the number of coating layers present in selected areas and their location in relation to the overall stratigraphy. Micro-invasive analysis of samples relied on a combination of spectroscopic and chromatographic techniques, including transmission Fourier-transform infrared (FTIR) spectroscopy, attenuated total reflection (ATR)-FTIR spectroscopy, and pyrolysis-gas chromatography/mass spectrometry (Py-GC/MS), aiming to determine the exact chemical composition of the coatings. Portable X-ray fluorescence (XRF), FTIR, Raman, and scanning electron microscopy with energy-dispersive X-ray spectroscopies (SEM/EDS) provided insight into the color palette used, with a focus on green paints. Investigation of the coatings revealed the application of multiple layers, including cellulose nitrate and localized areas of polyvinyl acetal. Analysis of the paint identified a limited range of inorganic pigments and, additionally, assisted in tackling issues that arose during the cleaning of specific colored areas. Results from this technical study helped address outstanding questions regarding this group of historical Tsimshian house posts, informing the development of a suitable treatment tailored to the safe removal or reduction of surface coatings and grime, ultimately improving the legibility of the design and colors.

Long-lived electrochromic device with multilevel bistability based on portable film-type polymer electrolytes

Long-lived electrochromic devices (ECDs) with multilevel bistability based on a portable film-type polymer electrolyte (PFPE) were fabricated and their optical and electrical properties were characterized. WO3 and NiOx, deposited via a vacuum method, were used as electrochromic materials, and PFPEs were assembled in ECDs by a transfer method. The PFPEs were fabricated by inserting a polyvinyl acetal (PVA) based gel electrolyte between a light and a tight release films. The PFPE-based ECD operated reliably for at least 109,000 cycles and showed excellent bistability in multilevel open circuits. For 30 min after removing the applied operating voltage, the ECD maintained 90% and 99% of the original coloration and decoloration transmittance at 550 nm, respectively. The average coloration and decoloration consumed charge and efficiency over 109,000 operation cycles were 4.2 and −4.5 mC/cm2 and 81.4 and −74.8 cm2/C, respectively.

Comparative evaluation of organic contamination sources from roller and pencil type PVA brushes during the Post-CMP cleaning process

In post-CMP (chemical mechanical polishing) processing, the use of poly vinyl acetal (PVA) brushes to clean the wafer surface is one of the most effective and prominent techniques applied for the removal of CMP contaminants. Recently, organic contaminants induced in different types of PVA brushes during brush manufacturing have been drawing substantial research interest in CMP communities. In this study, investigated the root cause of these residual organic impurities in two different types of PVA brushes was investigated: roller and pencil type brushes. PVA roller brushes have a skin layer due to the brush molding process, but pencil-type PVA brushes do not have the skin layer. Extraction of organic impurities from both types of brushes was accomplished using an ultrasound-assisted technique at a sonication frequency of 40 kHz, and input power of 600 W. Further evaluation of these organic impurities using Field Emission Scanning Electron Microscopy (FE-SEM) revealed a large number of organic impurities in roller brushes and negligible impurities in pencil brushes. Time of flight secondary ion mass spectrometry (TOF-SIMS) analysis confirmed polydimethylsiloxane (PDMS) as the organic impurities extracted from PVA roller brushes, which were generated during the brush manufacturing process. The PDMS content in PVA roller brushes was further analyzed using FE-SEM micrographs via dissolving the organic impurities in tetramethylammonium hydroxide solution (TMAH). During brush fabrication, the high content of PDMS organic impurities in roller PVA brushes is essentially attributed to the presence of the additional skin layer formed by the mold releasing agent at the mold-cavity interface.

Skin Layer Effects on Adhesion Forces of PVA Brushes and Its Temperature Dependence

Semiconductor devices have been achieved high performance by improving processing speed and integration degree due to downsize and multilayer wiring structure. Along with this tendency, the importance of CMP processing is increasing. In addition, due to many particles are generated after CMP process, post-CMP cleaning is also very important process. In the post-CMP cleaning, PVA (PolyVinyl Acetal) brush have been widely used. However, in this scrub cleaning, problems have been reported that many particles are generated from the PVA brush itself by adhesion of PVA brush onto surface and contaminated the wafer surface. Therefore, it is necessary to control adhesion between PVA brushes and semiconductor surfaces. In our early study, adhesion of PVA brush was evaluated by rotating torques or frictional forces. In this study, we tried to measure directly adhesion forces between PVA brush and several solid surfaces with a high response load cell. We believe that the measurement of the adhesion force can discriminate the material that is likely to adhere to the PVA brush. We compared the adhesion forces for two types of brushes with or without a skin layer. Moreover, we investigated whether adhesion force could be controlled by changing brush temperature. Because of the PVA brushes are porous polymer, mechanical properties change with its temperature. We consider that the temperature also affects adhesion force onto solid surfaces. In this study, we measured the adhesion forces between PVA brushes and solid surfaces in the atmosphere. The adhesion forces Fa were measured with a load cell. PVA brush was pressed against the test surfaces and releasing it at high speed after relaxing for a certain period of time tw . We used three types of test surfaces, Glass, Polymethyl methacrylate (PMMA) and Polytetrafluoroethylene (PTFE). The contact angles were 28°, 61° and 97°, respectively. The temperature of test surfaces were controlled with a Peltier device and were set to 20 degrees to 50 degrees. Attached figure shows an example of relationship between the adhesion force Fa of PVA brush with skin layer and relaxation time tw on the different surfaces. As shown in the figure, Fa increased with increase tw in the all surface cases. We consider that this cause is real contact area increased as the tw increased. In the dependence of test surfaces material, Glass and PTFE case showed similar adhesion force values. On the other hand, the forces of PMMA case showed larger values than other test surfaces. This result indicates that there are materials that strongly interacts with skin layer PVA brushes. In the experiments using without skin layer case, however, we could not measure the adhesion force in the all experimental conditions. This result suggests that without skin layer brush is maybe not contact onto surface and the adhesion force is strongly depended on the existence of skin layer. Next, we focus on temperature dependence of the adhesion forces. In the all test surface cases, adhesion force decreased with increase temperature. Particularly the adhesion force of the PMMA case was greatly decreased at 50 degrees. These results suggest that the temperature may control the adhesion force of PVA brush onto solid surface. Figure 1

Skin Layer Effects on Adhesion Forces of PVA Brushes and Its Temperature Dependence

In this study, the adhesion forces between PVA (PolyVinyl Acetal) brushes and solid surfaces were measured directly using a highly responsive load cell. The adhesion forces were compared based on contact time, and the influence of skin layer existence on PVA brush surface was investigated. In addition, the surface temperature dependence of the adhesion forces was also studied. Results showed that the adhesion force increased with increasing surface contact time. For a PMMA surface, significantly large adhesion forces were observed. It was also seen that the adhesion force decreased with increasing temperature. However, by using the present setup, the adhesion forces in all experimental conditions without skin layer brush cases could not be measured.

Ultrasound-induced break-in method for an incoming polyvinyl acetal (PVA) brush used during post-CMP cleaning process

Abstract The presence of particle contamination on a wafer surface is one of the most critical issues performed by chemical mechanical planarization (CMP) and post-CMP cleaning processes. Among the various sources of contaminations, an incoming polyvinyl acetal (PVA) brush generates fine impurities in the form of particulate residue during post-CMP cleaning. This study deals with removal of this particulate residue from the incoming PVA brush via a new ultrasound-assisted physical break-in process. Strong microturbulence and shock waves generated during the ultrasound-assisted cleaning process removed the particulate residue present in the incoming PVA brush in a short cleaning time of 5 min. A detailed study involving the effects of ultrasound frequency and input power and change in dissolved gas ratio was investigated on particulate residue using a liquid particle count test. Among the variously used ultrasonic parameters, a frequency of 40 kHz and an input power of 600 W showed the highest particulate residue removal from the incoming PVA brush without damaging the brush morphology. This removal of impurities from the brush is essentially attributed to the physical effect of ultrasound and cavitation due to generation of strong microturbulence and shock waves during the PVA brush cleaning process.

Study on possible root causes of contamination from an incoming PVA brush during post-CMP cleaning

Abstract Generation of organic defects is one of the most critical issues that encountered during post-CMP cleaning process in sub 10 nm semiconductor device fabrication. Among the many sources for producing organic defects, we found that an incoming polyvinyl acetal (PVA) brush itself acts as a vital contaminant source and is generating the organic defects during post-CMP cleaning. To find out the residual impurities of an incoming brush, we used a new break-in process to extract the brush contaminants systematically. This method has high efficiency in capturing the insoluble particulates as well as soluble contaminants from an incoming PVA brush by using ultrasonic cleaner in DIW. The insoluble particulate contaminants were extracted completely by using ultrasonication within 10 min. The analyzed particle sizes were ranged from 0.8 to 4 μm measured by a liquid particle counter and FE-SEM. The composition of soluble impurity was investigated by various analysis methods such as ICP-MS, LC-MS and TOF-SIMS. These results emphasize that residual impurities from an incoming PVA brush might be one of the main root causes of organic residues generated during post CMP cleaning process. It was found that the incoming brush could transfer organic contaminants like PDMS (Polydimethyl siloxane) and SDS (Sodium dodecyl sulfate) to the wafers. The proposed methodology is very effective and fast process to capture and analyze the impurities from the brush.

Environmental Effects on Post-CMP PVAc Brush Releasable Contamination and Break-In Optimization for Advanced Logic and Memory Technologies

Advanced sub-7nm logic and VNAND memory technologies are becoming more reliant on Chemical Mechanical Planarization (CMP). New layers and materials are being introduced with each new technology node and integration scheme. Polyvinyl-acetal (PVAc) brushes are used extensively for post-CMP contact cleaning and remain the most reliable method for efficient cleaning of slurry residues while minimizing physical damage to sensitive films and structures. The releasable contamination from the virgin PVAc brush, however, is becoming more of an issue with each new technology node often affecting the yield of the device being manufactured. As a result, users are required to “break-in” or pre-condition brushes much longer than before to meet the required defect performance for these technologies. Longer PVAc brush break-in times negatively impact CMP tool utilization and overall equipment efficiency (OEE). This work attempts to characterize PVAc brush releasable contamination sources under simulated post-CMP cleaning conditions and suggests ways to reduce the break-in burden. Liquid particles (LPCs) were analyzed in the brush effluent and samples were subsequently dried and characterized by Fourier-transform infrared spectroscopy (FTIR). Environmental effects such as brush handling, temperature cycling, and dehydration, as well as post-CMP chemistry acclimation were all deemed significant contributors to the final releasable contamination profile and break-in characteristics of the brush. The brush Pore Templating Agent (PTA) represented the largest contribution of particles early in the brush lifetime. Loose PVAc particles were also a significant source of brush releasable contamination. PTA residue appears to decreases rapidly during brush use, whereas PVAc particulates reduce at a slower rate and eventually become the primary source of liquid particles. The physical nature of the post-CMP process and surface changes observed on the brush nodule are evidence that PVAc particulate reduction is largely unavoidable. PVAc brush break-in times, nevertheless, were accelerated by more aggressive break-in conditions and the application of chemistries known to improve the hydrolysis and removal of PTA. Offline but onsite PVAc brush break-in may be the most effective way to recover CMP tool utilization while minimizing environmental and chemistry acclimation effects simultaneously.

Measurement Method for Adhesion Forces between Polyvinyl Acetal Brushes and Flat Surfaces

The adhesion force between two materials is a key factor in surface cleaning. In this study, we developed a method for measuring adhesion forces between polyvinyl acetal (PVA) brushes and several test surfaces to understand the brushes’ adhesion characteristics. We utilized both the viscoelastic properties of PVA brushes and a high-response load cell to evaluate the adhesion forces of the compressed brushes on a flat surface. The results of the study showed that the adhesion forces increased with increased contact time and amount of compression. Some materials strongly interacted with the PVA brushes. We also observed that the measured adhesion forces were due to the existence of a skin layer on the brush surface. Moreover, we compared the adhesion forces with torques generated from rotating PVA brushes. However, the results did not correlate with the adhesion forces, which suggests that the force in the quasi-static state differs from that in the sliding condition.

A Breakthrough Method for the Effective Conditioning of PVA Brush Used for Post-CMP Process

Polyvinyl acetal (PVA) brush cleaning is one of the most important processes in the post chemical mechanical planarization (CMP) cleaning process. However, PVA brush could be severely contaminated due to strong direct contact with a large amount of abrasive particles during the long-time post CMP cleaning, and the particles on the brush can be easily transported to the next wafer substrate. In this study, we tested four different types of conditioning processes to remove the particles from the brush to increase the cleaning efficiency of post CMP process and comparatively evaluated using FE-SEM. The physical scrubbing method showed higher cleaning efficiency than the chemically dipping method, but some abrasive particles remained on the non-contacted surface. The flow-through method using pH 11 showed the higher removal ability than pH 3 and 7 due to strong repulsive force between silica abrasive particle and PVA brush, but some abrasive particles remained due to non-uniform flow of chemicals. The ultrasonication method with DIW was found to be very effective to remove the particles completely from the brush without damage. Consequently, the new developed conditioning process provides an environmentally friendly and cost effective alternative conditioning process to the existing conditioning process of contaminated PVA brushes.

Impact of Flow Rate, Collection Devices, and Extraction Methods on Tear Concentrations Following Oral Administration of Doxycycline in Dogs and Cats.

Purpose: Compare the precision of doxycycline quantification in tear fluid collected with either Schirmer strips or polyvinyl acetal (PVA) sponges following oral drug administration.Methods: Three dogs and 3 cats were administered doxycycline orally at a dose of 4.2–5 mg/kg every 12 h for 6 consecutive days. At day 5 and 6, blood and tear fluid were sampled to capture doxycycline trough and maximal concentrations. Tear fluid was collected 3 times (spaced 10 min apart) at each session with the absorbent material placed in the lower conjunctival fornix until the 20-mm mark was reached (Schirmer strip, one eye) or for 1 min (PVA sponge, other eye). Tear extraction was performed with either centrifugation or elution in methanol. Doxycycline concentrations were measured with liquid chromatography–mass spectrometry. Low (100 ng/mL) and high (1,000 ng/mL) tear concentrations measured in vivo were spiked into each absorbent material in vitro to evaluate percentage drug recovery.Results: After oral administration of doxycycline, the drug reached the tear compartment at concentrations of 45.1–900.7 ng/mL in cats and 45.4–632.0 ng/mL in dogs, representing a tear-to-serum ratio of 12% and 16%, respectively. Doxycycline tear concentrations were significantly more precise when tear collection was performed with Schirmer strips rather than PVA sponges (P = 0.007), but were not correlated with tear flow rate. In vitro doxycycline recovery was poor to moderate (<75%).Conclusions: Schirmer strips represent a good option for lacrimal doxycycline quantification, although the collection and subsequent extraction have to be optimized to improve drug recovery.

Effect of tear collection on lacrimal total protein content in dogs and cats: a comparison between Schirmer strips and ophthalmic sponges

BackgroundQuantification of lacrimal total protein content (TPC) is an important tool for clinical scientists to understand disease pathogenesis, identify potential biomarkers and assess response to therapy, among other applications. However, TPC is not only affected by disease state but also by the method used for tear collection. Thus, the purpose of this study is to determine the impact on TPC of two methods of tear collection in dogs and cats: Schirmer strips and polyvinyl acetal (PVA) sponges.Methods(i) In vivo - Ten healthy dogs and 10 healthy cats were examined. Each animal underwent two sessions, separated by 10 min, in which a Schirmer strip was placed in one randomly selected eye until the 20-mm mark was reached, while a strip of PVA sponge was placed in the other eye for 1 min. (ii) In vitro - Schirmer strips and PVA sponges were spiked with various volumes of four bovine serum albumin solutions (0.5, 4, 10, and 20 mg/mL).In both experiments, the wetted absorbent materials were centrifuged for 1 min, and the TPC was quantified on the extracted fluid using Direct Detect™ infrared spectroscopy.ResultsLacrimal TPC in dogs and cats ranged from 5.2 to 14.6 mg/mL and from 6.2 to 20.6 mg/mL, respectively. In cats, TPC was significantly lower with Schirmer strips vs. PVA sponges (P < 0.001). In dogs, the volume absorbed by PVA sponges was negatively correlated with TPC (r = − 0.48, P = 0.033). The inter-session coefficient of variation was significantly lower with Schirmer strips vs. PVA sponges in both species (P ≤ 0.010). In vitro, both absorbent materials resulted in a ‘concentrating effect’ of the TPC obtained post-centrifugation, which was most pronounced when the volume absorbed was low, especially for Schirmer strips.ConclusionSchirmer strips provide a repeatable method to quantify lacrimal TPC in dogs and cats, although care should be taken to absorb sufficient volumes of tears to minimize the concentrating effect from the absorbent material.

Measurement of the Frictional Force between PVA Roller Brushes and Semiconductor Wafers with Various Films Immersed in Chemicals

To better understanding the lubrication condition between a polyvinyl acetal (PVA) brush and cleaning surfaces, we measured the frictional force between the PVA roller brushes and the semiconductor wafers with various films immersed in chemicals. The frictional force showed different tendencies depending on the combination of chemicals and surface films. Especially, the large fluctuation of friction force was observed under the combination of Cu and NH4OH.

偏光板と全反射接触顕微鏡を用いた固気液三相界面の観察

PVA (Polyvinyl acetal) brushes have been widely used for a wet cleaning in semiconductor device fabrication. To better understanding the lubrication condition between a PVA brush and cleaning surfaces, we observed gas-liquid-solid interface using a total reflection microscope with polarization plates. First we investigated the real contact area of a POM (Polyoxymethylene) ball by applying a normal load in air and water. Then we observed the contact condition of a PVA brush. As a result, the observed real contact areas of the POM ball were agreed with the estimation from the Hertzian contact theory. In addition, the real contact area between a PVA brush and a glass plate in water was also able to observe. The real contact areas were increased with increase the normal force acting on the PVA brush. We concluded that the part of a PVA brush is contact with a cleaning surface.

Characterization of self-adhesive structural tapes modified with polyvinyl acetal resins

Thermally curable self-adhesive structural tapes (SATs) based on epoxy resin/acrylate copolymer composition and modified with three types of polyvinyl acetal resins (i.e. polyvinyl butyral-stat-acetal and polyvinyl butyrals) were prepared. The influence of polyvinyl resins addition on reactivity and self-adhesive features of SATs as well as on mechanical resistance of aluminum-SAT-aluminum joints was investigated. It was revealed that polyacetal resin addition (0.5wt. part/100wt. parts of adhesive composition) increases the adhesion of SATs to a steel substrate and, moreover, improves the overlap shear strength of thermally cured joints. The type and content of applied polyvinyl acetals influence the enthalpy of the photocrosslinking process, crosslinking degree as well as the epoxy groups conversion of SATs matrix.