In this work thick target-proton induced X-ray emission (TT-PIXE) technique has been employed for the elemental analysis of soil samples collected from Budha nullah region of Ludhiana city, Punjab. TT-PIXE analysis of samples has been carried out using 3 MeV proton beam from 3 UD pelletron (9SDH2 from NEC, USA) facility at the Institute of Physics (IOP), Bhubaneswar, Orissa. The emitted X-rays were detected using Si(Li) detector (CANBERRA US, FWHM = 180 eV at 5.9 keV) positioned at 90° to the beam line and using suitable electronics. The trace elements {sub 15}P, {sub 16}S, {sub 19}K, {sub 20}Ca, {sub 22}Ti, {sub 24}Cr, {sub 25}Mn, {sub 26}Fe, {sub 29}Cu, {sub 30}Zn, {sub 33}As, {sub 37}Rb, {sub 38}Sr, and {sub 82}Pb were quantified in the soil samples. The quantitative estimation of PIXE spectrum of the soil samples was performed using GUPIX computer code. The presence of {sub 24}Cr, {sub 33}As, and {sub 82}Pb toxic elements in soils is likely to be due to the pollution caused by seepage of the water at the breached locations of nullah. The present study brings to focus the need to improve the effluent treatment of the industrial wastes and repair of the breached Budha nullah. In comparison to other analytical techniques for elemental analysis, PIXE is sensitive and its multi-elemental character brings advantage to investigators for the determination of minor and trace elements in a variety of soil samples. (author)