Herein, we report the nanoscale cations dynamics in Cs0.1MA0.15FA0.75PbI3 films during the electric-field-induced aging process using infrared scattering scanning near-field microscopy (IR s-SNOM) combined with a series of complementary analytical techniques such as PL-microscopy, SEM/EDX and ToF-SIMS. The revealed major field-induced aging pathways are related to the anodic oxidation of I− and the cathodic reduction of MA+ and FA+, which finally result in the depletion of organic species in the device channel and the formation of metallic lead. FA+ cations show significantly higher stability with respect to electrochemical reduction as compared to MA+ cations. Formamidinium cations are preserved on the surface of the near-cathode film area even after 40 days of the 1 V/μm field exposure, while MA+ cations demonstrate complete decomposition after 24 days. The obtained results demonstrate that IR s-SNOM represents a powerful technique for studying the spatially resolved field-induced degradation dynamics of hybrid perovskite absorbers and the identification of more promising materials resistant to the electric field.
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