Scanning Near-field Optical Microscopy Technique Research Articles

Near-field probing of surface plasmon polariton formation in imprinted gold nanoisland arrays

Large-area imprinting stamps with nanometer-scale features are a rapidly developing area of research in plasmonics. In integrated photonic structures, surface plasmon (SPs) and surface plasmon polaritons (SPPs) are tuned by selecting both the appropriate wavelength and the angle of incidence of the excitation light. The resulting exponential fields can be studied by an optical technique such as scanning near-field optical microscopy (SNOM). Here, we report on the application of the aperture-type SNOM technique to characterize, at nanoscopic and microscopic scales, the formation of the SPPs and the beat pattern formed with the superposition of SPs and the effective component of the probing light formed in discrete metallic nanostructures of Au fabricated on imprinting stamps. We discuss a model to describe the beat pattern in terms of this superposition and demonstrate that the dominant SPs have a transverse nature. Our experiments are supported by modeling the optical response and near-field in gold nanostructures using the simulation tool Tidy3D. Our results provide a straightforward way to investigate and characterize SPPs at the nanostructure level.

Scanning Near-Field Optical Microscopy: Recent Advances in Disordered and Correlated Disordered Photonics

Disordered and correlated disordered photonic materials have emerged in the past few decades and have been rapidly proposed as a complementary alternative to ordered photonics. These materials have thrived in the field of photonics, revealing the considerable impact of disorder with and without structural correlations on the scattering, transport, and localization of light in matter. Scanning near-field optical microscopy (SNOM) has proven to be a fundamental tool for the study of the interaction between light and matter at the nanoscale in such systems, allowing for the investigation of optical properties and local electromagnetic fields with extremely high spatial resolution, surpassing the diffraction limit of conventional optical microscopy. In this review, the most important and recent advances obtained for disordered and correlated disordered luminescent structures by means of the aperture SNOM technique are addressed, showing how it allows the tailoring of local density of states (LDOS), as well as providing access to statistical analysis for multi-resonance disordered and hyperuniform disordered structures at telecom wavelengths.

Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes**Supported by the National Natural Science Foundation of China under Grant Nos. 11574204 and 11774224, and the National Key Research and Development Program of China (2016YFA0302001). Z.S. acknowledges the Program for Professor of Special Appointment (Eastern Scholar) at Shanghai Institutions of Higher Learning and additional support from a Shanghai talent program.

Single-walled carbon nanotubes (SWCNTs), due to their outstanding electrical and optical properties, are expected to have extensive applications, such as in transparent conductive films and ultra-small field-effect transistors (FETs). However, those applications can only be best realized with pure metallic or pure semiconducting SWCNTs. Hence, identifying and separating metallic from semiconducting SWCNTs in as-grown samples are crucial. In addition, knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental science. Here we report employing scanning near-field optical microscopy (SNOM) as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO2/Si substrates. Metallic and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do not. The reliability of this method is verified using FET testing and Rayleigh scattering spectroscopy. Our result demonstrates that the SNOM technique provides a reliable, simple, noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.

Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio

Near-field scanning optical microscopy (NSOM) enables observation of light-matter interaction with a spatial resolution far below the diffraction limit without the need for a vacuum environment. However, modern NSOM techniques remain subject to a few fundamental restrictions. For example, concerning the aperture tip (a-tip), the throughput is extremely low, and the lateral resolution is poor; both are limited by the aperture size. Meanwhile, with regard to the scattering tip (s-tip), the signal-to-noise ratio (SNR) appears to be almost zero; consequently, one cannot directly use the measured data. In this work, we present a plasmonic tip (p-tip) developed by tailoring subwavelength annuli so as to couple internal radial illumination to surface plasmon polaritons (SPPs), resulting in an ultrastrong, superfocused spot. Our p-tip supports both a radial symmetric SPP excitation and a Fabry-Pérot resonance, and experimental results indicate an optical resolution of 10 nm, a topographic resolution of 10 nm, a throughput of 3.28%, and an outstanding SNR of up to 18.2 (nearly free of background). The demonstrated p-tip outperforms state-of-the-art NSOM tips and can be readily employed in near-field optics, nanolithography, tip-enhanced Raman spectroscopy, and other applications.

Direct Measurement of Nanoscale Lateral Carrier Diffusion: Toward Scanning Diffusion Microscopy

A multimode scanning near-field optical microscopy technique that allows the mapping of surface morphology, photoluminescence (PL) spectra in illumination and illumination-collection modes, and PL dynamics, all in one scan, has been developed along with a method to use it for evaluation of carrier diffusion. The method allows measuring diffusion lengths as small as ∼100 nm and their anisotropy and spatial distribution, parameters remaining inaccessible to conventional far-field techniques. The procedure has been applied to study ambipolar carrier diffusion in a nonpolar m-plane InGaN/GaN quantum well. The diffusion was found to be highly anisotropic with diffusion coefficients along and perpendicular to the wurtzite c axis equal to 0.4 and 1.9 cm2/s, respectively. The large diffusion anisotropy confirms band structure calculations that suggest that the topmost valence band in an m-plane InGaN quantum well is highly anisotropic.

Optical detection of graphene nanoribbons synthesized on stepped SiC surfaces

Graphene nanoribbons (GNRs) are nanostructures considered to be promising building blocks for the realization of graphene-based devices. The optical properties of GNRs are hard to determine due to their nanoscopic dimensions. Reflectance Anisotropy Spectroscopy/Reflectance Difference Spectroscopy (RAS/RDS) is a powerful optical tool to characterize highly anisotropic structures. RAS/RDS has shown to be very useful to measure the optical response of materials including semiconductor heterostructures. The technique is non-destructive and can be used in air or in vacuum conditions. Considering the highly anisotropic geometry of the GNRs, the RAS/RDS becomes a quite convenient technique to characterize the optical properties of GNRs and in general to study the dependence on the thickness of the optical properties of graphene. The GNRs used in the present work were synthesized on 6H-SiC stepped substrates and annealed in air to obtain quasi-free-standing bilayer graphene (widths: 240 nm, 210, and 120 nm). For this system, the isolation of the optical signal coming from the GNRs in the RAS spectra is not an easy task due to the fact that both GNRs and the 6H-SiC stepped substrate are highly anisotropic. To study and characterize the GNRs, we present and discuss an experimental approach to isolate the RAS signal coming from the GNRs. We also have performed nano-RAS measurements by using a near-field scanning optical microscopy technique (nanometric resolution) that supports our method. We show that RAS and nano-RAS are powerful complementary optical probes that can be used to characterize GNRs and also properties such as the visual transparency of one-, two-, or few-layer thick graphene.

The light-matter interaction of a single semiconducting AlGaN nanowire and noble metal Au nanoparticles in the sub-diffraction limit.

Near field scanning optical microscopy (NSOM) is not only a tool for imaging of sub-diffraction limited objects but also a prominent characteristic tool for understanding the intrinsic properties of nanostructures. In order to understand light-matter interactions in the near field regime using a NSOM technique with an excitation of 532 nm (2.33 eV), we selected an isolated single semiconducting AlGaN nanowire (NW) of diameter ∼120 nm grown via a vapor liquid solid (VLS) mechanism along with a metallic Au nanoparticle (NP) catalyst. The role of electronic transitions from different native defect related energy states of AlGaN is discussed in understanding the NSOM images for the semiconducting NW. The effect of strong surface plasmon resonance absorption of an excitation laser on the NSOM images for Au NPs, involved in the VLS growth mechanism of NWs, is also observed.

Optical Imaging of Liquid Crystals at the Nanoscale

The instrumentation associated with near-field scanning optical microscopy (NSOM) can be exploited to provide three-dimensional structure and dynamic information about liquid crystals at scales not possible with diffraction-limited tools. This Minireview focuses on our use of NSOM techniques to probe spatial variations of the nematic director and the nematic orientational order parameter on length scales as small as a few nanometers.

Piezotronic Effects on the Optical Properties of ZnO Nanowires

We report the piezotronic effects on the photoluminescence (PL) properties of bent ZnO nanowires (NWs). We find that the piezoelectric field largely modifies the spatial distribution of the photoexcited carriers in a bent ZnO NW. This effect, together with strain-induced changes in the energy band structure due to the piezoresistive effects, results in a net redshift of free exciton PL emission from a bent ZnO NW. At the large-size limit, this net redshift depends only on the strain parameter, but it is size-dependent if the diameter of the NW is comparable to that of the depletion layer. The experimental data obtained using the near-field scanning optical microscopy technique at low temperatures support our theoretical model.

Near-field optical microscopy of femtosecond-laser-reshaped silver nanoparticles in dielectric matrix

Samples containing single silver nanoparticles have been irradiated by intense femtosecond laser pulses to gain a persistent transformation of their shape to ellipsoidal forms. Irradiated and non-irradiated regions of these samples have been analyzed by microscope spectrometry as well as near-field scanning optical microscopy (NSOM) with several wavelengths and different linear polarizations. The results show the outstanding capability of NSOM technique to detect the individual shape of transformed metallic nanoparticles and to analyze their orientation and aspect ratio.

A Plasmonic Dimple Lens for Nanoscale Focusing of Light

Focusing electromagnetic energy to subwavelength dimensions has become an increasingly active field of research for a variety of applications such as heat-assisted magnetic recording, nanolithography, and nanoscale optical characterization of biological cells and single molecules using the near-field scanning optical microscopy technique. Double-sided surface plasmons in a metal-insulator-metal (MIM) geometry can have very small wavelengths for dielectric of thickness of less than 10 nm. A tapered dielectric structure sandwiched between metal can be used to efficiently couple electromagnetic energy from free space photons to the plasmonic wavelengths at the nanoscale. In this paper, we present the fabrication and characterization of a novel MIM plasmonic lens structure.

SNOM study of ferroelectric domains in doped [formula omitted] crystals

This work shows a study of the periodic ferroelectric domains formed in LiNbO3 crystals doped with rare earths by means of scanning near field optical microscopy (SNOM) technique. It has been observed periodic structures associated with ferroelectric domains with an unexpected high value of the optical contrast working under reflectance SNOM mode. From Raman-Nath diffraction patterns, a refractive index modulation of Δn∼10−4 has been calculated. These results were correlated with the ferroelectric periodic domains obtained by the SNOM technique. A light waveguide effects along the ferroelectric domains is suggested to explain the high reflectance contrast observed in SNOM experiments.

Direct Observation of Lateral Carrier Diffusion in Ridge Waveguide InGaNAs Lasers

We present results from measurements of the subthreshold lateral spontaneous emission profile in 1.3-mu m wavelength ridge waveguide InGaNAs quantum-well lasers using a scanning near-field optical microscopy technique. The measurements reveal the presence of significant lateral carrier diffusion which has a profound effect on the temperature dependence of the threshold current. This effect is frequently omitted when the characteristic temperature of the threshold current is considered.

Scanning near‐field optical microscopy (SNOM)

AbstractThe advent of Scanning Near‐field Optical Microscopy (SNOM) has augmented at a microscopic level the usefulness of optical spectroscopy and two‐dimensional imaging of chemical constituents makes this a very attractive and powerful new approach. In this paper we will review various configurations of the SNOM technique and some representative results obtained in material science and on biological samples by means of shear‐force, reflectivity and fluorescence, with a lateral resolution well below the diffraction limit. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Phase interpretation for polarization-dependent near-field images of high-density gratings

It has been described that the near-field images of a high-density grating at the half self-imaging distance could be different for TE and TM polarization states. We propose that the phases of the diffraction orders play an important role in such polarization dependence. The view is verified through the coincidence of the numerical result of finite-difference time-domain method and the reconstructed results from the rigorous coupled-wave analysis. Field distributions of TE and TM polarizations are given numerically for a grating with period d = 2.3 λ, which are verified through experiments with the scanning near-field optical microscopy technique. The concept of phase interpretation not only explains the polarization dependence at the half self-imaging distance of gratings with a physical view, but also, it could be widely used to describe the near-field diffraction of a variety of periodic diffractive optical elements whose feature size comparable to the wavelength.

SNOM on cell thin sections: observation of Jurkat and MDAMB453 cells

In this study a comparison of scanning near-field optical microscopy with a traditional, well-known microscopic technique like transmission electron microscopy is discussed. To establish a reliable and comparable method for high-resolution scanning near-field optical microscopy imaging of biological samples, the attention is focussed on cell sections. In particular, we present a study of ultrathin sections of Jurkat T-cells and MDAMB453 cells. We show the relationship among the scanning near-field optical microscopy (topographic and optical) images and the kind of embedding medium (resin), the sections thickness and the staining of the sample. For a complementary investigation atomic force microscopy measurements are carried out, as well. The study reveals that scanning near-field optical microscopy technique on opportunely prepared thin sections can be applied successfully for investigation of the interior of the cells. Scanning near-field optical microscopy and transmission electron microscopy allow to obtain different, however comparable, and complementary information of the cell sample.

Characterization of long-range surface plasmon-polariton in stripe waveguides using scanning near-field optical microscopy

Propagation characteristics of long-range surface plasmon-polariton (LRSPP) guiding along thin gold stripes embedded in polymer cover layers are investigated by scanning near-field optical microscopy (SNOM). It is shown that the characterization of samples with cover layers up to 10 μm is feasible in the optical communication wavelength range. We found that the spatial dimension of the optical signal is directly related to the geometrical dimension of the guiding layer, and the light collected by the SNOM is scattered light from the surface and not the evanescent field. We also discuss the limitations of the SNOM technique for the characterization of LRSPP modes.

Polarization-dependent Talbot effect

The term "polarization-dependent Talbot effect" means that the Talbot self-imaging intensity of a high-density grating is different for TE and TM polarization modes. Numerical simulations with the finite-difference time-domain method show that the polarization dependence of the Talbot images is obvious for gratings with period d between 2 lambda and 3 lambda. Such a polarization-dependent difference for TE and TM polarization of a high-density grating of 630 lines/mm (corresponding to d/lambda=2.5) is verified through experiments with the scanning near-field optical microscopy technique, in which a He-Ne laser is used as its polarization is changed from the TE mode to the TM mode. The polarization-dependent Talbot effect should help us to understand more clearly the diffraction behavior of a high-density grating in nano-optics and contribute to wide application of the Talbot effect.

Investigation of the Doughnut Effect in Cy3-Labeled Protein Microarrays using Scanning Near-Field Optical Microscope

We demonstrate the fluorescence mapping of protein microarrays by the technique of scanning near-field optical microscopy (SNOM) and confocal microscopy. Micron sized spots (300 μm) of human Immunoglobulin G (hIgG) protein with and without a Cy3 dye labeling have been fabricated on glass substrates by an immobilization method which makes use of calixcrown derivatives termed Prolinker. We have also tried to probe into the well-known “doughnut effect” observed in fluorescence images of proteins using the SNOM technique. The topographic and fluorescence SNOM images revealed that the number of proteins at the boundary of the spot were more than at the center in the case of the microarray spot which showed brighter luminescence at the edge than at the center in the confocal image.

The Influence of Defects on the Propagation Light within Polymeric Optical Waveguides Studied by Polarized Near-Field Scanning Optical Microscopy

We have developed a polarization-preserving near-field scanning optical microscopy (NSOM) optical fiber probe and with it observed the influence of defects and weak stresses on a propagation light within polymeric optical waveguides. To characterize the influence, we intentionally printed an indentation in the vicinity of the waveguide and then evaluated the resulting influence using polarized guide-collection-mode NSOM images taken around the indentation. When transverse magnetic polarized light enters a waveguide, the light intensity becomes greater on the near side of the indentation than on the far side, as measured by a linearly polarized component perpendicular to the direction of light propagation. The most probable cause of this phenomenon is microdefects generated by the printing of the indentation. The polarized NSOM technique is useful in searching for small defects or stresses within integrated photonic devices.