The combination of focused electron beam induced deposition (FEBID) and magnetic force microscopy (MFM) has opened up new possibilities in nanoscale magnetic imaging. FEBID offers precise control over the dimensions and magnetic properties of the MFM probes, enabling the development of high-performance magnetic tips with enhanced capabilities compared to conventional ones. These improved tips offer superior resolution, sensitivity, and versatility in nanoscale magnetic surface characterization. Here, we compare the performance of a commercial MFM tip and a FEBID-grown Fe tip in a Ni80Fe20/NdCo5 film. The FEBID tip exhibited superior lateral resolution for topography imaging, likely due to its sharper and well-defined geometry, with a tip diameter of approximately 20 nm. MFM measurements further confirmed this advantage, revealing better-defined magnetic domains and higher magnetic contrast with the FEBID-functionalized probes compared to the commercial tip. This improvement can be attributed to the possibility to optimize the tip-sample magnetic interaction for the FEBID tip. By reducing the lift height of the second pass, we were able to bring the tip closer to the sample, enhancing the magnetic signal without introducing significant topographic artifacts. Overall, these findings highlight the potential of FEBID for creating high-resolution and high-sensitivity MFM tips.