This work examines the adoption of radio frequency (RF) sputtering at power ranging from 100 to 300 W to deposit nanostructured titanium dioxide (TiO2) thin films on indium tin oxide (ITO)-coated polyethylene terephthalate (PET) flexible substrate (ITO/PET) at room temperature. At higher RF power, X-ray diffraction (XRD) results exhibited evolution from amorphous into crystalline anatase with preferred (101) orientation and the films revealed spherical-like nanostructures with increasing grain size from 15.71 to 21.57 nm. Films transparency decreased from 79% to 70%. Estimated energy gap decreased from 3.57 to 3.36 eV, while refractive index increased from 2.19 to 2.25, denoting a red shift in the films. The thin film deposited at 300 W exhibited high conductivity and mobility of 19.65 × 10−5 Ω−1 cm−1 and 0.30 cm2/Vs, respectively. The film demonstrated its capability as an electron transport layer for flexible perovskite solar cells.
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