The nc-Ge thin films are grown at a moderately low temperature (∼220 °C) in rf PECVD via optimizing the GeH4 plasma with H2-dilution, within 97.5 ≤ D(H2)(%) ≤ 99.5. At elevated D(H2), while the bonded H-content in the matrix reduces, the film's crystallinity and dc conductivity increase. However, the optical band gap widens for 97.5 ≤ D(H2)(%) ≤ 98.5, via the elevated quantum confinement effect from the increased number of Ge-ncs of dimension below Bohr radius. Conversely, for D(H2) ≥ 98.5%, switching in the quantum effect in larger-sized Ge-ncs induces the band gap narrowing. Significantly reduced ultra-nanocrystalline-Ge (unc-Ge) component occupying the grain boundary zone, minimizes the contribution of grain-boundary defects. However, the persistent amorphous Ge matrix becomes highly defective and less dense, and those induce enhanced O-absorption from the ambient in the dominant Ge-Ox (x < 2) configuration. On increased crystallinity, the activation energies of dipole relaxation (ΔEτ) and resistance (ΔE) in the impedance data reduce dominantly in the a-Ge component than its nc-Ge counterpart, which occurs identically for the dc conductivity when the amorphous component in the matrix sharply disappears at increased D(H2) > 98.5%. A narrow band gap (∼0.90 eV), conducting (σd ∼3.0 ×10−2 S cm−1), and photosensitive nc-Ge network, involving dominant <111>-oriented Ge-ncs (∼35.2 nm) of enriched volume fraction (XC ∼90.2%), obtained at D(H2) ∼99.5%, seems extremely useful for need-based applications as a narrow band gap absorber layer in the bottom sub-cell of flexible high-efficiency cost-effective multijunction thin film solar cells.
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