Miniaturization trends in high-frequency electronics have led to accommodation challenges in the integration of the corresponding components. Size reduction thereof has become a practical necessity. At the same time, the increasing performance demands imposed on electronic systems remain in conflict with component miniaturization. On the practical side, the challenges related to handling design constraints are aggravated by the high cost of system evaluation, normally requiring full-wave electromagnetic (EM) analysis. Some of these issues can be alleviated by implicit constraint handling using the penalty function approach. Yet, its performance depends on the arrangement of the penalty factors, necessitating a costly trial-and-error procedure to identify their optimum setup. A workaround is offered by the recently proposed algorithms with automatic adaptation of the penalty factors using different adjustment schemes. However, these intricate strategies require a continuous problem-dependent adaptation of the penalty function throughout the entire optimization process. Alternative methodologies have been proposed by taking an explicit approach to handle the inequality constraints, along with correction-based control over equality conditions, the combination of which proves to be demonstrably competitive for some miniaturization tasks. Nevertheless, optimization-based miniaturization, whether using implicit or explicit constraint handling, remains a computationally expensive task. A reliable way of reducing the aforementioned costs is the incorporation of multi-resolution EM fidelity models into the miniaturization procedure. Therein, the principal operation is based on the simultaneous monitoring of factors such as quality of the constraint satisfaction, as well as algorithm convergence status. This paper provides an overview of the abovementioned size-reduction algorithms, in which theoretical considerations are illustrated using a number of antenna and microwave circuit case studies.
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