Abstract A benchmark problem is formulated which is well suited for the validation of mesoscopic phase-field models for grain-boundary migration in polycrystals. First, an analytical steady-state solution of the sharp moving boundary problem is derived for a symmetric lamellar structure, which is valid for arbitrary bulk driving forces and triple junction angles. Characteristic quantities are identified to reduce the parameter space which in turn allows a systematic comparison of simulations and analytical results. Various multiphase-field (MPF) formulations are compared which approximate the sharp interface problem in terms of a diffuse regularization. An interfacial thickness convergence study reveals that the model error is largely dependent on the ratio of bulk to interfacial stabilizing force as well as the underlying model formulation. An additional grid convergence study highlights the efficiency of a more advanced discretization scheme. The results can be used to guide the selection of appropriate models and to estimate the interface thickness and spatial resolution required to achieve a given accuracy target. The post-processing framework consists of a fully automated determination of well-defined metrics from the phase field simulation data, eliminating human bias and facilitating reproducibility. The corresponding code is made openly available to assist the materials science and engineering community in validating MPF, multi-order parameter and similar model developments. We believe that this work provides a reliable benchmark procedure to better understand the potentials and limitations of current multiphase-field models as well as alternative approaches.
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