Mode Atomic Force Microscopy Imaging Research Articles

Study on particle size and field effect with sp2/sp3 ratio of hydrogenated diamond-like carbon

Hydrogenated diamond-like carbon (HDLC) films were synthesized through a reactive gas-plasma process employing methane (CH4) and hydrogen (H2) as precursor gases on a silicon (100) wafer substrate, conducted at room temperature. The deposition process utilized a biased enhanced nucleation technique, varying the flow rate ratio of hydrogen and methane. The investigations revealed that increasing the methane flow rate led to a reduction in grain size and an augmented nucleation density of HDLC, as evidenced by contact-mode atomic force microscopy (AFM) images. This study demonstrated the effective control of diamond grain growth by introducing high-methane-concentration pulses during deposition. The field emission characteristics of HDLC samples were analyzed, revealing threshold fields of 12.2 V/μm for nanocrystalline films, 8.5 V/μm for subcrystalline films and 4.1 V/μm for microcrystalline films, corroborated by Raman spectra. Surface energy measurements indicated hydrophobic behavior in the samples. Notably, a decrease in the hydrogen/methane ratio was found to increase the sp2 character, which correlated with the emission field. AFM analysis of HDLC samples yielded surface roughness values ranging from 0.2 nm to approximately 0.01 nm, confirming the continuous, non-porous and smooth nature of the surfaces.

Effect of Probe Lifting Height in Jumping Mode AFM for Living Cell Imaging

Atomic force microscopy (AFM) is one of the effective methods for imaging the morphological and physical properties of living cells in a near-physiological environment. However, several problems caused by the adhesion of living cells and extension of the cell membranes seriously affect the image quality during living cell imaging, hindering the study of living cells. In this work, jumping mode AFM imaging was used to image living cells at varied probe lifting heights to meet image quality requirements, and image quality related to the probe lifting height is discussed in detail. The jumping mode was divided into three parts based on the varying heights of the lifted probe, namely near-contact mode, half-jumping mode, and full-jumping mode, and the causes of their imaging drawbacks were analyzed. At an appropriate lifting height, the probe can be completely free from the influence of cell adhesion and self-excited oscillation, thus avoiding the occurrence of “trail” phenomena and invalid points in the imaging of living cells and improving the image quality. Additionally, this work provides a new approach to calculating the lateral force through the adhesion of trace and retrace scanning at a low height, which is important for studying the extension characteristics of the cell membrane.

(Digital Presentation) Investigation of Microstructure Dependent Inhibitor Adsorption Mechanism on Carbon Steel By in Situ Atomic Force Microscopy

In the petroleum industry, organic surfactant type inhibitors have been widely applied in the oil and gas industry considering their high efficiency. Carbon steels with various carbide contents have also been used extensively as pipeline materials during the transport and storage of crude oil due to their excellent mechanical properties and low cost. The previous investigation of inhibition mechanism on carbon steel is limited by lack of surface characterization techniques at a molecular level. Atomic force microscopy (AFM) can not only provide localized visual observation, but can also achieve the detection of mechanical properties of an inhibitor film. In this study, in situ AFM contact mode friction imaging and in situ AFM tapping mode phase imaging techniques have been applied to investigate the influence of the ferritic-pearlitic microstructure of carbon steel on inhibitor adsorption mechanisms during CO2 corrosion under different inhibitor concentrations. At concentration above surface saturation, AFM contact mode friction images show a large friction contrast between inhibitor covered cementite structures and ferrite structures, while in the absence of inhibitor, this friction contrast almost disappears, indicating the inhibitor adsorption induced this difference. AFM tapping mode phase images indicate uniform adsorption of inhibitor on both cementite and ferrite structures.The differences observed in these AFM analyses indicate that the adhesion force of inhibitor molecules on cementite could be smaller than on ferrite, or the molecular orientations of inhibitor molecules adsorbed on cementite and ferrite structures could be different. The special adsorption behavior of inhibitor molecules on cementite means the carbide component of the microstructure could directly influence inhibitor adsorption and may decrease inhibitor efficiency. Simultaneous linear polarization resistance tests in electrochemical AFM (EC-AFM) cell indicates a maximum inhibition efficiency at concentration above saturation.Keywords : Contact mode AFM, friction contrast, tapping mode AFM, phase contrast, cementite, ferrite, organic inhibitor, adhesion force.Statement of importance:Studies related to inhibitor adsorption mechanisms on ferritc-pearlitic carbon steels can be connected with the practical issues that iron carbide can impair the corrosion inhibitor performance on carbon steels. This AFM work connects the corrosion inhibition effect with the carbon steel components at a molecular level for the first time. Physical explanations regarding the interactions between inhibitor molecules and carbon steel microstructures can also be provided with the assistance of molecular simulations.Figure caption: Contact and tapping mode AFM images of inhibitor film formed on UNS G1018 steel at 2 CMC (100ppm) tetradecyldimethylbenzylammonium inhibitor + 1 wt% NaCl. The contact mode friction image indicates a large friction contrast between inhibitor covered cementite and ferrite structure, while the tapping mode phase image indicates a negligible softness contrast between cementite and ferrite structure. Figure 1

Correlating polymer structure, dynamics, and function with atomic force microscopy

AbstractSince its development, atomic force microscopy (AFM) has become an indispensable tool for investigating fundamental and technological applications of polymer materials. The versatility of AFM imaging modes and operating conditions allows for nanoscale characterization of a range of dynamic processes, such as crystallization, phase separation, self assembly, and electronic transport. Advances in AFM technology, particularly high‐speed and high‐resolution imaging, enable investigation of polymer structure, function, and dynamics in real world conditions and across a range of relevant spatial and temporal scales. In this perspective, we highlight a collection of recent polymer studies that utilize AFM to correlate the function and structure of polymer films, with focus on its multiparametric imaging capabilities. As the complexity of polymer materials and morphologies continues to increase, AFM is well poised to meet the accompanying demand for nanoscale imaging and characterization.

Multiparametric atomic force microscopy imaging of single native exosomes.

The advent of atomic force microscopy (AFM) provides a novel powerful tool for addressing biological issues in their native states. AFM uses a sharp tip mounted at the end of a microfabricated cantilever to probe the specimens immobilized on the support. Compared with other high-resolution imaging and measurement techniques (e.g. super-resolution optical microscopy, scanning electron microscopy, transmission electron microscopy, and magnetic/optical tweezers), the unique merit of AFM is that it is able to simultaneously acquire the structures and properties of living biological samples under aqueous conditions with unprecedented spatiotemporal resolution (nanometer spatial resolution and millisecond temporal resolution) [1], making AFM an invaluable platform for revealing the underlying mechanisms guiding life activities. The wide applications of AFM in molecular and cell biology provide considerable novel insights into the physiological/pathological processes [2]. Particularly, in recent years, a new AFM imaging mode, which is called peak force tapping (PFT)...

A time-dependent study of nano-mechanical and ultrastructural properties of internal limiting membrane under ocriplasmin treatment

Vitreomacular traction (VMT) syndrome has only been surgically treated for a long time. Recently, enzymatic vitreolysis with ocriplasmin has emerged as a possible option to release VMT and, in some cases, close full thickness macular holes (FTMHs). Despite its clinical relevance, gathering information about the ocriplasmin-induced alterations of the Inner Limiting Membrane (ILM) of the retina in a clinical study is a complex task, mainly because of the inter-individual variability among patients. To obtain more insights into the mechanism underlying the drug action, we studied in-vitro the mechanical and morphological changes of the ILM using Atomic Force Microscopy (AFM). To this aim, we measured the ILM average Young's modulus (YM), hysteresis (H) and adhesion work (A) over time under ocriplasmin treatment. Our data unveil a time-dependent increase in the membrane YM of 19% of its initial value, along with changes in its adhesive and dissipative behavior. Such modifications well correlate with the morphological alterations detected in the AFM imaging mode. Taken all together, the results here presented provide more insights into the mechanism underlying the ocriplasmin action in-vivo, suggesting that it is only able to alter the top-most layer of the vitreal side of the membrane, not compromising the inner ILM structure.

Qualitative and Quantitative Changes to Escherichia coli during Treatment with Magainin 2 Observed in Native Conditions by Atomic Force Microscopy.

The bacterial membrane has been suggested as a good target for future antibiotics, so it is important to understand how naturally occurring antibiotics like antimicrobial peptides (AMPs) disrupt those membranes. The interaction of the AMP magainin 2 (MAG2) with the bacterial cell membrane has been well characterized using supported lipid substrates, unilamellar vesicles, and spheroplasts created from bacterial cells. However, to fully understand how MAG2 kills bacteria, we must consider its effect on the outer membrane found in Gram-negative bacteria. Here, we use atomic force microscopy (AFM) to directly investigate MAG2 interaction with the outer membrane of Escherichia coli and characterize the biophysical consequences of MAG2 treatment under native conditions. While propidium iodide penetration indicates that MAG2 permeabilizes cells within seconds, a corresponding decrease in cellular turgor pressure is not observed until minutes after MAG2 application, suggesting that cellular homeostasis machinery may be responsible for helping the cell maintain turgor pressure despite a loss of membrane integrity. AFM imaging and force measurement modes applied in tandem reveal that the outer membrane becomes pitted, more flexible, and more adhesive after MAG2 treatment. MAG2 appears to have a highly disruptive effect on the outer membrane, extending the known mechanism of MAG2 to the Gram-negative outer membrane.

Tapping Mode AFM Imaging in Liquids with blueDrive Photothermal Excitation

Abstract

Visualization of internal in situ cell structure by atomic force microscopy.

Light and electron microscopy have been used to study cell structure for many years, but atomic force microscopy is a more recent technique used to analyze cells, mainly due to the absence of techniques to prepare the samples. Isolated molecules or organelles, whole cells, and to a lesser extent in situ cell structure have been observed by different atomic force microscopy imaging modes. Here, we review efforts intended to analyze in situ the cell structures using approaches involving imaging of the surface of semithin sections of samples embedded in resin and sections prepared with an ultramicrotome. The results of such studies are discussed in relation to their implications to analyze the fine structure of organelles at the nanoscale in situ at enhanced resolution compared to light microscopy.

Glucose Oxidation Using Copper Hydroxide Nanosheet Electrode

Non-enzymatic electrocatalysts have recently received much attention as a glucose sensor. These catalysts basically contain transition metals such as Pt, Au, Ni, and Cu. The glucose adsorbs onto the surface of the catalytic electrode and is oxidized by hydroxyl radicals. Smaller structured materials make the surface area larger, thus nanostructured electrode is expected to show efficient oxidation of glucose. As a nanomaterial, nanosheets have recently received much attention as a new material with an ultimate two-dimensional anisotropy. Inorganic nanosheets have been prepared by delamination of layered materials. We synthesized copper hydroxide in which dodecylbenzene sulfonate intercalated and delamination of these compounds to monolayer nanosheets. Copper oxide and hydroxide are viable candidates for the non-enzymatic electrochemical glucose sensor, thus copper hydroxide nanosheets are expected to make novel non-enzymatic electrochemical glucose sensor. In this study, we synthesized copper hydroxide nanosheet and investigated its electrochemical oxidation of glucose. The precursor of the nanosheet was a layered copper hydroxide synthesized by the ion exchange of dodecylbenzene sulfonate with acetate in Cu2(OH)3(CH3COO)·H2O. The Cu2(OH)3(CH3COO)·H2O was synthesized by hydrolysis of Cu(CH3COO)2·H2O solution (0.1 M) by heating at 65 °C for several days until crystalline product formed. The Cu(OH)3(CH3COO)·H2O (0.042 g) was added to the solution of NaDBS (DBS– = dodecylbenzene sulfonate, 26.6 mM, 40 mL) and shaken at 30 °C for 18 h. The precipitate was separated by centrifugation and washed with water and air dried. The yielded product (0.053 g) is named as Cu-DBS. The nanosheet was prepared by delamination of Cu-DBS by dispersion in 1-butanol. To make dispersion, the Cu-DBS (0.03 g) in 1-butanol (45 mL) was shaken and let stand for 2-4 weeks. The supernatant of the dispersion was used to further measurements. To make a working electrode, the 15 g of the dispersion of the copper hydroxide nanosheet was concentrated by an evaporator and dried after dropped on the ϕ 3 mm glassy carbon (GC) electrode. Electrochemical measurements of this working electrode were carried out in a standard one-compartment cell equipped with an additional bare GC working electrode, a platinum wire counter electrode, and an Ag/AgCl reference electrode in 0.1 M NaOH solution. The morphology and size of nanosheets in the dispersion were examined by atomic force microscopy (AFM), which revealed nanosheet structure. The examined samples were prepared by deposition of a droplet of the dispersion on a silicon wafer. Intermittent contact mode AFM images showed two-dimensional ultrathin sheets with the lateral dimensions of ca. 2 μm. Some aggregates were occasionally observed. The height profile reveals that the sheets have a fairly flat terrace with a thickness of 4.33-6.30 nm with 320-460 aspect ratio and some sheets are stacked step by step with keeping the height. If DBS– ions place perpendicular to the hydroxide layer, the minimum thickness of the sheets should be ca. 5 nm because DBS– ions (22–25 Å) coordinate the hydroxide layer both on surfaces of the copper hydroxide sheet. Therefore DBS chains would align closely to the hydroxide layers at an angle of ca. 40 °. These copper hydroxide nanosheets are thin enough to be considered as a monolayer. Cyclic voltammetry (CV) was measured at 20 mV/s scan rate after addition of glucose solution to 0-2 mmol/l concentration (Fig. 1). The CV of the nanosheet coated electrode showed oxidation current peak at around +0.6 V vs. Ag/AgCl and this peak current increased as the concentration of glucose increased. This peak was not detected with only the GC electrode thus current peak was caused by the oxidation of glucose. Amperometry was measured at +0.6V vs. Ag/AgCl with successive addition of glucose solution (Fig. 2). The concentration of glucose increased to 0.1 to 27.8 mM, the current of the nanosheet coated electrode increased in a stepwise when glucose solution was added. The current was not detected with only the GC electrode. Glucose concentration and catalytic current were almost proportional. When the linear range is 0.1 to 4.9 mM, the sensitivity was 1.16 mA mM-1cm-2 from the slope. This value is comparable to the other glucose electrolytic oxidation electrodes using copper. Figure 1

(Multi)functional Atomic Force Microscopy Imaging.

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.

Quantification of in-contact probe-sample electrostatic forces with dynamic atomic force microscopy

Atomic force microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnessed in several AFM imaging modes. Here, we demonstrate a cantilever-resonance-based method to quantify electrostatic forces on a probe in the probe-sample junction in the presence of a surface potential or when a bias voltage is applied to the AFM probe. We find that the electrostatic forces acting on the probe tip apex can produce signals equivalent to a few pm of surface displacement. In combination with modeling, the measurements of the force were used to access the strength of the electrical field at the probe tip apex in contact with a sample. We find an evidence that the electric field strength in the junction can reach ca. 1 V nm−1 at a bias voltage of a few volts and is limited by non-ideality of the tip-sample contact. This field is sufficiently strong to significantly influence material states and kinetic processes through charge injection, Maxwell stress, shifts of phase equilibria, and reduction of energy barriers for activated processes. Besides, the results provide a baseline for accounting for the effects of local electrostatic forces in electromechanical AFM measurements as well as offer additional means to probe ionic mobility and field-induced phenomena in solids.

Insight into mechanics of AFM tip-based nanomachining: bending of cantilevers and machined grooves

Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research investigations. Values of the load applied to the tip at the free end of the AFM cantilever probe used for nanomachining are always large enough to induce plastic deformation on the specimen surface contrary to the small load values used for the conventional contact mode AFM imaging. This study describes an important phenomenon specific for AFM nanomachining in the forward direction: under certain processing conditions, the deformed shape of the cantilever probe may change from a convex to a concave orientation. The phenomenon can principally change the depth and width of grooves machined, e.g. the grooves machined on a single crystal copper specimen may increase by 50% on average following such a change in the deformed shape of the cantilever. It is argued that this phenomenon can take place even when the AFM-based tool is operated in the so-called force-controlled mode. The study involves the refined theoretical analysis of cantilever probe bending, the analysis of experimental signals monitored during the backward and forward AFM tip-based machining and the inspection of the topography of produced grooves.

Accurate thickness measurement of graphene

Graphene has emerged as a material with a vast variety of applications. The electronic, optical and mechanical properties of graphene are strongly influenced by the number of layers present in a sample. As a result, the dimensional characterization of graphene films is crucial, especially with the continued development of new synthesis methods and applications. A number of techniques exist to determine the thickness of graphene films including optical contrast, Raman scattering and scanning probe microscopy techniques. Atomic force microscopy (AFM), in particular, is used extensively since it provides three-dimensional images that enable the measurement of the lateral dimensions of graphene films as well as the thickness, and by extension the number of layers present. However, in the literature AFM has proven to be inaccurate with a wide range of measured values for single layer graphene thickness reported (between 0.4 and 1.7 nm). This discrepancy has been attributed to tip-surface interactions, image feedback settings and surface chemistry. In this work, we use standard and carbon nanotube modified AFM probes and a relatively new AFM imaging mode known as PeakForce tapping mode to establish a protocol that will allow users to accurately determine the thickness of graphene films. In particular, the error in measuring the first layer is reduced from 0.1–1.3 nm to 0.1–0.3 nm. Furthermore, in the process we establish that the graphene-substrate adsorbate layer and imaging force, in particular the pressure the tip exerts on the surface, are crucial components in the accurate measurement of graphene using AFM. These findings can be applied to other 2D materials.

PeakForce Tapping resolves individual microvilli on living cells.

Microvilli are a common structure found on epithelial cells that increase the apical surface thus enhancing the transmembrane transport capacity and also serve as one of the cell's mechanosensors. These structures are composed of microfilaments and cytoplasm, covered by plasma membrane. Epithelial cell function is usually coupled to the density of microvilli and its individual size illustrated by diseases, in which microvilli degradation causes malabsorption and diarrhea. Atomic force microscopy (AFM) has been widely used to study the topography and morphology of living cells. Visualizing soft and flexible structures such as microvilli on the apical surface of a live cell has been very challenging because the native microvilli structures are displaced and deformed by the interaction with the probe. PeakForce Tapping® is an AFM imaging mode, which allows reducing tip–sample interactions in time (microseconds) and controlling force in the low pico‐Newton range. Data acquisition of this mode was optimized by using a newly developed PeakForce QNM‐Live Cell probe, having a short cantilever with a 17‐µm‐long tip that minimizes hydrodynamic effects between the cantilever and the sample surface. In this paper, we have demonstrated for the first time the visualization of the microvilli on living kidney cells with AFM using PeakForce Tapping. The structures observed display a force dependence representing either the whole microvilli or just the tips of the microvilli layer. Together, PeakForce Tapping allows force control in the low pico‐Newton range and enables the visualization of very soft and flexible structures on living cells under physiological conditions. © 2015 The Authors Journal of Molecular Recognition Published by John Wiley & Sons Ltd.

Investigation of temperature induced mechanical changes in supported bilayers by variants of tapping mode atomic force microscopy.

Tapping mode atomic force microscopy (AFM) is an invaluable technique for examining topographical features of biological materials in solution, and there has been a growing interest in developing techniques to provide further compositional contrast and information concerning surface mechanical properties. Phase shifts, cantilever response at higher harmonic frequencies of the drive, and time-resolved tip/sample force reconstruction have all been shown to provide additional compositional contrast of surfaces, as compared to basic tapping mode AFM imaging. This study aimed to demonstrate the relative ability of these different imaging techniques to detect temperature induced changes in the elastic modulus of supported total brain lipid extract (TBLE) bilayer patches on mica. To aid in direct comparison between the different imaging techniques, all required data was obtained simultaneously while capturing traditional tapping mode AFM topography images. While all of the techniques were able to provide compositional contrast consistent with known temperature-induced changes in the bilayer patch, interpretation of the resulting contrast was not always straightforward. Phase imaging suffered from contrast inversion. Individual harmonics responded in a variety of ways to the temperature-induced changes in elastic modulus of the bilayer. The maximum tapping force (or peak force) associated with imaging the bilayer correctly reflected the changes in elastic modulus of the lipid bilayer. Importantly, as the required data can be obtained simultaneously, combining these different imaging techniques can lead to a more complete understanding of a sample's mechanical features.

Challenges in imaging of soft layers and structures at solid surfaces using atomic force microscopy

Imaging of soft, deformable fluid layers and structures, such as submicron droplets and bubbles or two-dimensional fluid patches, at solid interfaces with an atomic force microscopy (AFM) is a very challenging task. In this article, the authors describe the most common imaging AFM modes and advances in tapping mode AFM imaging of soft systems, as well as discuss the most common artifacts occurring in such experiments during imaging of soft and deformable features at solid interfaces. In general, for rigid and deformable systems, images recorded with the AFM are always a convolution of the tip geometry and the shape of the features being imaged. With deformable samples, the size and shape of the imaged features can additionally be affected by the imaging parameters such as set-point or gains. In addition, AFM images can be easily misprocessed with image enhancement software, resulting in an image that does not represent real features at the surface is created. This review will highlight the necessary procedures to ensure successful and accurate image acquisition in soft features in AFM.

Nanostructural change of human melanocytes stimulated with α-melanocyte stimulating hormone observed by atomic force microscopy.

It is well known that α-melanocyte stimulating hormone (α-MSH) induces melanization, but structural changes of melanocytes after α-MSH exposure are not well known. This study investigated the serial morphologic changes of human cultured melanocytes after stimulation with α-MSH using atomic force microscopy (AFM). Cultured human melanocytes were treated with α-MSH for 7 days. Contact mode AFM images were obtained using a NANOstation II and fixed melanocytes were scanned in PBS solution at a resolution of 512 × 512 pixels, at a scan speed of 0.4 line/s. The surface roughness and pore-like structures of the melanocytes were measured from topographic images using the Scanning Probe Imaging Processor. The surface roughness of cell body did not change significantly over time. All three roughness parameters (Sa, Sq, Sz) inside the pore-like structures on the dendrites increased significantly. The number of pore-like structures increased and the length and the breadth of pore-like structures also increased gradually. Pore-like structures changed statistically significantly in response to α-MSH stimulation. Further study will be needed to clarify whether the nature of pore-like structures is related to movement of melanosomes.

Tip-based nanoscale selective growth of discrete silicon nanowires by near-field laser illumination

Growth of discrete silicon nanowires is reported with nanoscale location selectivity by employing near-field laser illumination. An uncoated dielectric atomic force microscope (AFM) tip provides a nanometer-scale light source that is sufficiently localized to induce nucleation and subsequent growth of a single nanowire under its optical near-field. Far-field laser-induced heating is additionally supplied to the substrate to both relieve the required near-field light budget and also assist stable epitaxial growth. Specific catalysts are selected for the nanowire growth by non-contact mode AFM imaging. Through real-time monitoring of the deflection of the AFM cantilever during the growth process, the gap between the tip and the sample and hence truly near-field illumination are maintained throughout the growth process. The study shows that tip-based near-field laser illumination could be an effective tool for the direct integration of semiconductor nanowires.

Error-corrected AFM: a simple and broadly applicable approach for substantially improving AFM image accuracy

Atomic force microscopy (AFM) has become an indispensable tool for imaging the topography and properties of surfaces at the nanoscale. A ubiquitous problem, however, is that optimal accuracy demands smooth surfaces, slow scanning, and expert users, contrary to many AFM applications and practical use patterns. Accordingly, a simple correction to AFM topographic images is implemented, incorporating error signals such as deflection and/or amplitude data that have long been available but quantitatively underexploited. This is demonstrated to substantially improve both height and lateral accuracy for expert users, with a corresponding 3–5 fold decrease in image error. Common image artifacts due to inexperienced AFM use, generally poorly scanned surfaces, or high speed images acquired in as fast as 7 s, are also shown to be effectively rectified, returning results equivalent to standard ‘expert-user’ images. This concept is proven for contact mode AFM, AC-mode, and high speed imaging, as well as property mapping such as phase contrast, with obvious extensions to many specialized AFM variations as well. Conveniently, as this correction procedure is based on either real time or post-processing, it is easily employed for future as well as legacy AFM systems and data. Such error-corrected AFM therefore offers a simple, broadly applicable approach for more accurate, more efficient, and more user-friendly implementation of AFM for nanoscale topography and property mapping.