We report a structured illumination microscopy (SIM) reconstruction method based on polarization modulation (PM), which can suppress background noise by utilizing the polarization-sensitivity properties of fluorescent dipoles. The proposed method employs a ferroelectric liquid crystal (FLC) spatial light modulator (SLM) to generate multidirectional interference patterns, and uses a combination of two liquid crystal variable phase retarders (LCVRs) and a quarter-wave plate (QWP) for flexible and rapid polarization modulation. The results of simulations and experiments demonstrate that the combination of SIM and PM effectively suppresses background noise in SIM with a slight improvement in resolution. This technique also solves the problem of structural distortion that occasionally exists in SIM and improves the accuracy of the reconstruction.