International Conference On Computer-Aided Design Research Articles

Report on the 28th Asia and South Pacific Design Automation Conference

The 28th Asia and South Pacific Design Automation Conference (ASP-DAC 2023) was held at Miraikan, National Museum of Emerging Science and Innovation, Tokyo, Japan, 16 char6319 January 2023. ASP-DAC, started in 1995, is a high-quality and premium conference on Electronic Design Automation (EDA) like other sister conferences such as Design Automation Conference (DAC); Design, Automation Test in Europe (DATE); International Conference on Computer Aided Design (ICCAD); and Embedded Systems Week (ESWEEK). ASP-DAC 2023 adopted an in-person conference style with online features which is the first time in ASP-DAC. Even though the last two ASP-DAC conferences were held as virtual conferences due to the COVID-19 pandemic, ASPDAC 2023 provided opportunities for face-to-face communication not only at sessions, but also at coffee breaks, banquet, and so on for in-person attendees. Online access mainly for participants who were difficult to physically attend was also provided as much as possible.

The 2022 International Conference on Computer-Aided Design (ICCAD)

Jointly sponsored by ACM and IEEE, the International Conference on Computer-Aided Design (ICCAD) is a premier forum to explore new challenges, present leading-edge innovative solutions, and identify emerging technologies in the electronic design automation (EDA) research areas. ICCAD covers the full range of computer-aided design (CAD) topics—from the device and circuit levels up through the system level, as well as post-CMOS design.

The 2021 Asia and South Pacific Design Automation Conference (ASPDAC)

ASP-DAC was founded in 1995, and over the years it has become one of the primary conferences in the electronic design automation (EDA) field. Now, it has established itself as a prestigious conference along with her sister conferences, which include Design Automation Conference (DAC), International Conference on Computer-Aided Design (ICCAD), Design, Automation and Test in Europe Conference (DATE), and Embedded Systems Week (EWEEK). It has continuously offered opportunities to explore the latest advances in the design techniques and provide face-to-face connections and networking opportunities for research and EDA professionals all over the world.

Report on the 38th ACM/IEEE International Conference on Computer-Aided Design (ICCAD 2019)

Jointly sponsored by ACM and IEEE, the International Conference on Computer-Aided Design (ICCAD) is the premier forum to explore emerging technology challenges in electronic design automation (EDA), to present leading-edge research and development solutions, and to identify future roadmaps for the design automation research areas.

Conference Reports: Recap of the 24th Asia and South Pacific Design Automation Conference

The 24th Asia and South Pacific Design Automation Conference (ASP-DAC) was held at Miraikan, National Museum of Emerging Science and Innovation, Tokyo, Japan, on 21–24 January 2019. ASP-DAC is a high-quality, premium conference in the electronic design automation (EDA) area, like other sister conferences such as the Design Automation Conference (DAC); Design, Automation, & Test in Europe (DATE); the International Conference on Computer Aided Design (ICCAD); and Embedded Systems Week (ESWEEK). ASP-DAC started in 1995 and has continuously offered the opportunity to know the recent advanced technologies on IC chip design and design automation areas, as well as to enable communication between researchers and designers around Asia and the South Pacific regions. As the first event in Tokyo, 346 researchers from 22 countries gathered not only from Asia and the South Pacific region but also from North America and Europe.

Conference Reports: Recap of the 37th Edition of the International Conference on Computer-Aided Design (ICCAD 2018)

Jointly sponsored by IEEE and ACM, the International Conference on Computer-Aided Design (ICCAD) is the premier forum to explore emerging technology challenges in electronic design automation, present leading-edge research and development solutions, and identify future roadmaps for design automation research areas. This year, ICCAD was held in San Diego, CA, on 4–8 November 2018 at the Hilton Resort in Mission Bay. San Diego’s dependably perfect weather made for a great backdrop for the 37 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</sup> installment of the conference. We had over 400 attendees at ICCAD this year for the regular program and workshops combined, thanks in part to the location. We hope to have ICCAD back in San Diego at some point in the near future.

Conference Reports: Report on the 2017 International Conference on Computer-Aided Design (ICCAD)

The 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) concluded successfully on 16 November 2017. The conference was held at the Marriott Hotel, Irvine, CA, USA, thus returning to California after a couple of years in Austin, TX, USA. An interesting and varied program focused primarily on electronic design automation (EDA) was presented to an enthusiastic audience of over 400 participants from several regions of the world covering over 25 countries.

Guest Editorial

Guest Editorial

Highlights of ICCAD 2016

Jointly sponsored by the IEEE Council on Electronic Design Automation (CEDA), ACM Special Interest Group on Design Automation (SIGDA), and IEEE Circuits and Systems Society, the International Conference on Computer-Aided Design (ICCAD) is a premium technical conference serving researchers, students, and practitioners in the EDA area. It also serves researchers in related fields such as computer architecture, circuits, device modeling, testing, formal verification, embedded systems, cyberphysical systems, and hardware security. For the second year in a row, the 2016 ICCAD was held in Austin, TX, USA.

Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature Extraction

Because of the widening sub-wavelength lithography gap in advanced fabrication technology, lithography hotspot detection has become an essential task in design for manufacturability. Unlike current state-of-the-art works, which unite pattern matching and machine-learning engines, we fully exploit the strengths of machine learning using novel techniques. By combing topological classification and critical feature extraction, our hotspot detection framework achieves very high accuracy. Furthermore, to speed-up the evaluation, we verify only possible layout clips instead of full-layout scanning. We utilize feedback learning and present redundant clip removal to reduce the false alarm. Experimental results show that the proposed framework is very accurate and demonstrates a rapid training convergence. Moreover, our framework outperforms the 2012 CAD contest at International Conference on Computer-Aided Design (ICCAD) winner on accuracy and false alarm.

Multiple block structure-preserving reduced order modeling of interconnect circuits

In this paper, we propose a generalized multiple-block structure-preserving reduced order interconnect macromodeling method (BSPRIM). Our approach extends the structure-preserving model order reduction (MOR) method SPRIM [R.W. Freund, SPRIM: structure-preserving reduced-order interconnect macromodeling, in: Proceedings of International Conference on Computer Aided Design (ICCAD), 2004, pp. 80–87] into more general block forms. We first show how an SPRIM-like structure-preserving MOR method can be extended to deal with admittance RLC circuit matrices and show that the 2 q moments are still matched and symmetry is preserved. Then we present the new BSPRIM method to deal with more circuit partitions for linear dynamic circuits formulated in impedance and admittance forms. The reduced models by BSPRIM will still match the 2 q moments and preserve the circuit structure properties like symmetry as SPRIM does. We also show that BSPRIM can build the compact models with similar size and accuracy of that produced by traditional projection based methods but using less computation costs. Experimental results show that BSPRIM outperforms SPRIM in terms of accuracy with more partitions and outperforms PRIMA with less CPU times for generating the same accurate models.

The International Conference on Computer Aided Design (ICCAD) Previews Novel Program, External Workshops will Collocate with ICCAD on 10–13 November in San Jose

External Workshops will Collocate with International Conference on Computer Aided Design on 10-13 November , 2008 in San Jose The International Conference on Computer-Aided Design (ICCAD) 2008 will offer 122 outstanding papers split into 40 sessions over three days in San Jose from 10-13 November, plus four half-day tutorials, three embedded tutorials, and two special designer sessions providing additional perspectives. ICCAD will also open its doors to new external workshops which will be collocated with the conference.

An efficient terminal and model order reduction algorithm

The paper proposes an efficient terminal and model order reduction method for compact modeling of interconnect circuits with many terminals. The new method is inspired by the recently proposed terminal reduction method, SVDMOR [P. Feldmann, F. Liu, Sparse and efficient reduced order modeling of linear subcircuits with large number of terminals, in: Proceedings of the International Conference on Computer Aided Design (ICCAD), 2004, pp. 88–92]. But different from SVDMOR, the new method considers higher order moment information for terminal responses during the terminal reduction and separately applies singular value decomposition (SVD) on both input and output terminals for low-rank approximations. This is in contrast to the SVDMOR method where input and output terminal responses are approximated by SVD at the same time, which can lead to large errors when the numbers of inputs and outputs are quite different. We analyze the passivity requirements for SVD-based terminal and model order reduction and show that the combined passive terminal and MOR using SVD method will not lead an effective terminal reduction in general. Our experimental results show that the proposed ESVDMOR method outperforms the SVDMOR method in terms of accuracy for the same reduced model sizes when the numbers of input and output terminals are quite different.

ICCAD 2006 will Focus on Current Applications and Challenges Faced by Future Technologies, More than 750 Expected at Meeting on 5–9 November in San Jose

The International Conference on Computer Aided Design (ICCAD) will again provide attendees the rich and high-quality technical content in design technology that they have come to expect, focusing on the pressing problems of today's IC designs such as power and variability and the challenges of future technologies, both CMOS and beyond.

International Conference on Computer-Aided Design (ICCAD) meets 7–11 November in San Jose

International Conference on Computer-Aided Design (ICCAD) meets 7–11 November in San Jose

First cadathlon programming contest held at 2002 ICCAD

In the spirit of the long-running ACM programming contest, the Special Interest Group on Design Automation (SIGDA) organized an EDA programming contest, the CADathlon. SIGDA held the CADathlon on 10 November 2002, at the Double Tree Hotel in San Jose, Calif., as part of the Sunday program for the International Conference on Computer-Aided Design (ICCAD). Students, working in teams of two, competed to solve six problems from different CAD areas. The CADathlon challenged students in their CAD knowledge, and in their problem-solving, programming, and team-working skills. The contest provided a platform for academia and industry to focus attention on the best and brightest of next-generation CAD professionals. The CADathlon is an innovative initiative that assists in attracting top students to the EDA field.