This paper focused on nonlinear distortion modeling and characterization of AlGaN/GaN HEMT on SiC substrate using a two-tone intermodulation measurement. The variation of Taylor series coefficients with temperature: linear terms ( ${G}_{ {m}}$ and ${G}_{ {ds}}$ ), nonlinear terms ( ${G}_{ {m2}}$ , ${G}_{ {m3}}$ , ${G}_{ {ds2}}$ , and ${G}_{ {ds3}}$ ), and the cross terms ( ${G}_{ {md}}$ , ${G}_{ {md2}}$ , and ${G}_{ {m2d}}$ ) are reported. Furthermore, in the saturation region, the magnitude of ${G}_{ {ds}}$ related linear, nonlinear, and cross terms ( ${G}_{ {ds}}$ , ${G}_{ {ds2}}$ , ${ G}_{ {ds3}}$ , ${G}_{ {md}}$ , ${ G}_{ {md2}}$ , and ${G}_{ {m2d}}$ ) are found to be minimal. This implies that the nonlinear distortion behavior of the device is transconductance-dependent. A temperature-dependent current-based empirical model taking into account bias, input power, and frequency for the nonlinearity of the device has been developed based on two-tone measurements. The modeled data are consistent with the two-tone measurements, providing an effective means for analyzing these devices.