This article presents reliability models for multi-component systems subjected to multiple internally dependent degradation processes and external shocks in dynamic environments. We use the homogeneous semi-Markov process (HSMP) to describe the evolution of the environment state and the non-homogeneous Poisson process (NHPP) to model the arrival of shocks. The degradation processes of the system components are modeled using either general path models (GPM) or stochastic processes. The models highlight the shock-induced degradation acceleration, the degradation-shock dependence, and the influence of dynamic environments on the degradation processes and shock damage. The integrated process evolution (i.e., system degradations, shock arrivals, and environment shifts) follows a non-homogeneous Markov renewal process (NHMRP) in a multidimensional space. The NHMRP semi-Markov kernel and theoretical formulation for system reliability are derived. We provide a simulation algorithm to estimate system reliability. Finally, we demonstrate the theoretical correctness and applicability of the model using a micro-electro-mechanical system (MEMS).