In this study, the electromagnetic (EM) wave absorption properties of a two-layered structure composed of La0.7Sr0.3MnO3-epoxy (10 wt.%) (LSMO) and SrFe9.5Co1.25Ti1.25O19-epoxy (10 wt.%) (SFCTO), both exhibiting distinct high-frequency magnetic and dielectric properties, were investigated using a High Frequency Simulation Software (HFSS) simulation tool. LSMO had a high dielectric constant (ε' >30) within the measurement range (0.1-18 GHz), indicating that dielectric loss mechanisms primarily contribute to EM wave absorption. In contrast, SFCTO is a material capable of significantly absorbing EM waves near 10 GHz due to ferromagnetic resonance (FMR). The simulations were validated by comparing the measured and simulated reflection losses (RL) of an unpatterned LSMO/SFCTO bilayer. The RL spectra were examined by varying the layer thickness and pattern size in three configurations: a continuous LSMO/SFCTO structure, a cross-patterned LSMO on SFCTO, and a square-patterned LSMO on SFCTO. In the continuous LSMO/SFCTO structure, tunable absorption frequency bands were achieved by adjusting the layer thickness. However, it was difficult to achieve broadband absorption due to the reflective characteristics of the high dielectric LSMO layer. The cross-patterned LSMO structure on SFCTO demonstrated broader bandwidth absorption, with layer thickness being more influential than pattern width. The square-patterned LSMO on SFCTO exhibited the best broadband EM wave absorption (max Δf = 7.39 GHz). These results suggest that broader absorption is achievable by partially covering the high-dielectric layer with patterns on a hexaferrite sheet.
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