Abstract We have theoretically investigated the drag resistivity in electron-electron bilayer system by using the random phase approximation (RPA) for weakly interacting regime, at low temperature, high density, and large interlayer separation limit. We show analytical expressions by using long wavelength (low frequency regime) expansion of response function in Boltzmann regime and bare Coulomb interaction for non homogeneous dielectric environment which make the system interested and different compare to others. The influence of electron-electron bare inter and intra layer interaction are considered static cause of static local form factor (LFF) approximation in coupled layer system of non homogeneous dielectric background. The effective dielectric function and LFF are obtained from the solution of the Poisson equation of a three-layer dielectric medium. The effects of local form factors are included in bare inter and intralayer potential, yields the dependency of layer separation and dielectric constants of the materials. Drag resistivity dependency is measured numerically with respect to temperature T and density n and compared to other 2DES, which yields to possess the same qualitative and quantitative behaviour compare to bilayer system of homogeneous dielectric environment.
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