We have developed an optical technique for the two-dimensional mapping of water film thickness. The technique is based on infrared light absorption. A near-infrared camera is used to capture the radiation returning from a surface illuminated by a halogen lamp. The attenuation of the back-scattered radiation is used as a measure for the thickness of the water film covering the surface. The method was calibrated using well-defined liquid films between a glass plate and the surface. Series of instantaneous, two-dimensional thickness profiles of wavy turbulent free-falling films along a vertical wall were measured at a frame rate of 200 Hz. The evolution of complex flow patterns with three-dimensional instabilities such as long waves and capillary waves was observed under isothermal conditions. For the validation of the method, simultaneous independent measurements were taken together with an electrical high-speed liquid film sensor.