In two-dimensional (2D) material studies, tracking the anisotropic ultrafast carrier dynamics is essential for the development of optoelectronic nano-devices. Conventionally, the anisotropic optical and electronic properties are investigated via either polarization-dependent Raman spectroscopy or field-effect transistors measurements. However, study of the anisotropic transient carrier behaviors is still challenging, due largely to the lack of picosecond-resolved acquisition or programmable scanning capabilities in the current characterization systems. In this work, we select Ta2NiSe5 as a model system to investigate the ultrafast anisotropic transportation properties of photo-excited carriers and transient polarized responses via a digital micromirror device (DMD)-based pump-probe microscope, where the probe beam scans along the armchair and zigzag directions of a crystal structure via binary holography to obtain distinct carrier diffusion coefficients, respectively. The results reveal the nonlinear diffusion behaviors of Ta2NiSe5 in tens of picoseconds, which are attributed to the interplay between excited electrons and phonons. The trend of the measured local polarization-dependent transient reflectivity is consistent with the polarized Raman spectra results. These results show that the DMD-based pump-probe microscope is an effective and versatile tool to study the optoelectronic properties of 2D materials.
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