PADC track etching parameters measured in 1994 and 2021 were compared. Track fading over the longest time (27 years) was determined. The etching conditions of the samples were reproduced as closely as possible, namely 6.25M NaOH and 50 °C. The difference in track parameters of diameter, bulk, track etch rate, and detector sensitivity with detector depth for 1.89 GeV N, 0.96 GeV C, 19.2 GeV Ar, 46.48 GeV Fe, and 17.7 GeV Ni have been measured. Track diameter growth with etching time, te was observed for N, C, Ar, Fe, and Ni tracks and compared with 1994 data. Clear larger bulk and track etch rates have been observed for the current measurements compared to the previous ones for the 5 ions under investigation. A significant reduction in PADC sensitivity due to fading was observed after these twenty-seven years. The higher the ion's LET, the more the fading. The reduction rate was calculated, and a sensitivity correction formula was introduced. Detector sensitivity at any previous time can be calculated from the current sensitivity by the suggested equation. The physical and chemical explanations for the fading changes in different track parameters were suggested.
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