The reflection of 30 keV molecular N + 2 ions from the (100) face of copper crystal has been studied experimentally. Under the examined experimental conditions, the yield of the reflected molecular ions has been found to sharply increase when the primary ion incidence plane gets parallel to the axis of the surface semichannels formed by the close-packed atomic rows of a single-crystal target. The magnitude of the effect is more than 15 times as high compared with random orientation of the primary beam with respect to the irradiated crystal target.