In this study, we examined the physico-chemical properties of In2S3 powder produced using the solid-state reaction and of the In2S3 thin film obtained using the thermal evaporation technique. Thermally evaporated In2S3 thin films were subjected to vacuum annealing to study the impact of heating on the structural, morphological and optical properties of the samples. According to the X-ray diffraction analysis, the microstructure of as-grown thin films were an amorphous in nature which transformed into polycrystalline structure after annealing at T≥250 °C. This polycrystalline structure suggests the formation of the β-In2S3 phase with a tetragonal and/or cubic crystal structure. In addition, the energy dispersive spectroscopy analysis revealed that all samples show a slight excess of indium and a deficit of sulfur, compared to the stoichiometric ratios. Moreover, surface micrographs recorded by atomic force microscopy showed an increase in surface roughness after annealing. Optically, the transmittance spectra, T(λ), illustrated a high transmittance average value,∼70 %, while the reflectance spectra, R(λ), showed an average value of 25 % in the visible and NIR region. It appeared that heat treatment had no significant impact on the T and R spectra. The optical dispersion parameters of the treated samples were also studied. The direct and indirect allowed bandgap transitions values of all samples were found to ranging from 1.75 to 2.48 eV and from 1.80 to 2.38 eV, respectively. Such observation shows that the bandgap increased with annealing temperature. Electrically, n-type conductivity for In2S3 films annealed at 250 °C was recorded.
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