In an earlier study of ours (Li et al., IUCrJ,2019 6, 968–983), we conjectured that small-angle X-ray scattering (SAXS) in semicrystalline polymers might be from evanescence wave-induced scattering (Ievi) rather than claimed by classical scattering theory, the incident X-ray-induced scattering (Iin). In this study, we systematically compared Ievi and Iin under the influence of various factors, i.e., linear crystallinity, the number of lamellar crystals (N), the characteristic penetration depth of evanescent wave (dp*) and long period distribution, identifying the method to distinguish SAXS in semicrystalline polymers is from Iin or Ievi. Applying this method to SAXS of a high-density polyethylene (HDPE) sample, it was found that even excluding the influence of instrumental broadening and lamellar thickness/long period dispersity, the SAXS peak in HDPE is still greater than theoretically maximum peak width induced by Iin, indicating the SAXS in HDPE is not induced by incident X-ray directly. Excluding the interference of long period dispersity, it was found that dp* was around 5.9 nm, clearly demonstrating the existence of evanescent wave. Besides, results indicated that the lateral size determined with new theory is accurate, which in turn demonstrated that our assumption that Ievi is from a lamellar stack parallel to incident X-ray is reasonable. Taking all evidences together, it can be concluded safely that SAXS in HDPE is induced by evanescent wave.
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