Electron Micrographs Of Surface Replicas Research Articles

Electron micrography and x-ray study of dip-lacquered LiF (220)

It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured approximately 10-A rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to approximately 60 A measured on the bare LiF(220) crystal surface.

Defining the fractal nature of thin-film top surfaces from microdensitometer analysis of electron micrographs of surface replicas

Defining the fractal nature of thin-film top surfaces from microdensitometer analysis of electron micrographs of surface replicas

Defining the fractal nature of thin‐film top surfaces from microdensitometer analysis of electron micrographs of surface replicas

In this paper, the very first results are reported about searching for the fractal nature of thin‐film top surfaces from the surface relief reconstructed by microdensitometer analysis of an electron micrograph of a shadowed replica of the surface. It is found that such a reconstruction could be very helpful when dealing with the fractal nature of a surface.

Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicas

From the micrograph density of a shadowed carbon replica of a surface it is possible, by using a microdensitometer analysis, to rebuild line by line the profile of that surface. After summarizing the different stages necessary for such a reconstruction, we study the influence on the restored profiles of the various parameters that are encountered during the various steps of experiment and computation. It is shown that the most important parameters are the shadow-casting angle, microdensitometer scanning aperture, and filtering characteristics. Other parameters such as magnification micrograph, microdensitometer scanning speed, and microdensitometer noise play a minor role. The best way to choose and fit the appropriate value of the various parameters is discussed.

Study of surface roughness for thin films of CaF 2 deposited on glass substrates

The dependence of the surface roughness of CaF 2 thin films on the film thickness d is determined by a technique using microdensitometer analysis of electron micrographs of surface replicas. The rms surface roughness δ and the autocovariance length σ have been found to depend linearly on d in the range 250 < d < 4000 Å. Discrepancies between our values of δ and σ, and corresponding values deduced from interferometric and surface plasmon techniques are discussed.

Height and slope distributions for surfaces of rough metallic deposits

This paper deals with the accurate determination of height and slope distributions for surfaces of rough metallic deposits (magnesium, copper, silver, and gold). These distributions are computed using a microdensitometer analysis of electron micrographs of surface replicas. It is shown that most of the surfaces examined have reasonable Gaussian height and slope distributions. Apart from magnesium surfaces, the rms roughnesses determined from these distributions agree (within the accuracy range of their measurements) with rms roughnesses deduced from the autocovariance functions computed previously. Within the framework of scalar scattering theory, some emphasis is laid on the value of slopes to draw certain conclusions about the validity of the assumptions under which the scalar scattering theory is derived.

Validity of surface-roughness study using microdensitometer analysis of electron micrographs of surface replicas

We reconstruct the micrograph images from surface profiles previously obtained1 by using microdensitometer analysis of electron micrographs of surface replicas. These micrograph images compare favorably with the original images.

Investigation of Pre-Cambrian Thucholite

Biochemical identification of ammo-acids and monosaccharides in carbonaceous materials from the Witwatersrand indicates that there was life in Pre-Cambrian times. Electron micrographs of surface replicas of the surrounding rocks also suggest a probable organic derivation of these carbon concentrations.

Size and rate of growth of crystals on aluminium oxide films

AbstractThe sizes of crystals on aluminium oxide films formed by exposing commercial aluminium (2S) and two nickel‐ and iron‐containing alloys to pure water at high temperature were determined by measuring and counting crystals on electron micrographs of surface replicas. The mean crystal size was determined for eight different times at five temperatures over the range 150–350°. The increase in crystal size followed a law of the type D = Ain and the values of n found were in the range 0.18–0.26. The size distributions for various times at 300° and for various temperatures after 7 h. of exposure are discussed.