The use of electron diffraction in the SEM, particularly by the Electron Back-Scattering Pattern (EBSP) technique, has matured sufficiently to command a significant role in the materials research laboratory. The unique combination of high spatial resolution of the analyses, modest restrictions on sample size and preparation, quantitative nature of the experimental results, ease of experiment, and high sample throughput have produced a new demand for a SEM diffraction facility. In addition, x-ray diffraction facilities using tubetype generators (w/diffractometers and cameras) and electron diffraction facilities using the transmission electron microscope can both productively transfer some of their work load to a SEM diffraction facility. Some research efforts in our laboratory which depend on the SEM diffraction facility include studies of machining induced deformation structures in Ni-based superalloys, grain-structure/grain-alignment in high temperature superconductors, crystallography of fracture in Ti-based alloys, orientation relationships in direcnonally solidified multi-phase alloys, texture development during CVD diamond growth, and micro-texture effects in corrosion susceptibility of Zr-based alloys. Factors which insure continued growth in the SEM diffraction area are: relatively low cost of required instrumentation, continuing improvement in detector design and technology, continuing improvement in system automation (and therefor sample throughput), and growing awareness of the unique capabilities of SEM diffraction techniques.