ABSTRACT To investigate the arc erosion performance of Cu–diamond composites, Cu–5vol.-% diamond composites were fabricated using the hot-pressing sintering method. Compared to pure copper, Cu–5vol.-% diamond composites exhibited improvements in Brinell hardness of 60.1 HB. The relative density and electrical conductivity of Cu–5vol.-% diamond composites were 97.54% and 83.29% IACS (International Annealing Copper Standard), respectively, with no significant decrease compared to pure copper. The thermal conductivity was 423.48 W·(m·K)−1, showing a slight enhancement. The effect of different load voltages on the arc erosion behaviour of Cu–5vol.-% diamond composites was investigated. Experimental results indicated that as the voltage rose from 3 to 7 kV, the breakdown strength decreased from 7.164 × 106 V m–1 to 2.535 × 106 V m–1, while the arc duration increased from 21.752 × 10−3 s to 28.864 × 10−3 s, and the breakdown current rose from 10.8 to 27.2 A. Additionally, the presence of diamond particles enhanced the viscosity of the molten pool, thus the splashing phenomenon of copper liquid during arc discharge was not obvious, indicating that the material loss was small. Few cracks and holes were detected. The Cu–5 vol.-% diamond composites possess good resistance to arc erosion.