Electrochemically grown zinc oxide thin films have applications in photovoltaics, optoelectronics, and piezoelectrics. Potentiostatic electrodeposition using zinc nitrate typically includes the use of an Ag/AgCl electrode to measure solution potential, which can leak silver chloride into the growth solution. The effects of chloride contamination in the growth solution on the properties of potentiostatically and galvanostatically grown zinc oxide films were investigated. The incorporation of the chloride was particularly notable for galvanostatically grown films deposited for longer than 2 h. The effects of the chloride on the electronic and crystallographic properties of the film were examined with scanning electron microscopy, X-ray diffraction, energy-dispersive spectroscopy, and resistance measurements. Using an Ag/AgCl electrode during the long-term growth of zinc oxide films contaminated the films with chloride, resulting in poor crystallinity, reduced chemical purity, inconsistent electrical conductivity, poor transparency, and a rough film surface.
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