In practical applications, smart meters will fail, and even have batch quality problems. In addition to the sampling inspection of the arrival quality of smart meters, the analysis of the failure mechanism of smart meters has become an important and long-term task. This article mainly analyzes the component capacitance commonly used in smart meters, and analyses the failure of chip multilayer ceramic dielectric capacitors from appearance observation, electrical parameter testing, metallographic slicing, and at the same time from electrolytic appearance observation, electrical parameter testing, X- RAY, SEM and EDS for failure analysis. The results of failure mechanism research not only help to improve the reliability of the domestic energy meter manufacturing level, but also can save energy meter maintenance and transformation costs, and have very important practical significance for the construction of smart grids.
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