Scanning Transmission Electron Microscopy Diffraction Research Articles

Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamics

Scanning Transmission Electron Microscopy Diffraction Contrast Imaging (STEM-DCI) has been gaining popularity for the identification and analysis of dislocations in crystalline materials due to its ability to supress undesirable image features that are often present in conventional TEM images. However, there does not yet exist a robust body of work demonstrating expected contrast in these imaging conditions. A novel approach for the simulation of STEM-DCI images was developed using a modified form of the scattering matrix formalism. This algorithm was used to simulate a variety of dislocation configurations generated using three-dimensional discrete dislocation dynamics.

Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping

In this work, a recently developed electron diffraction technique called diffraction scanning transmission electron microscopy (D-STEM) is coupled with precession electron microscopy to obtain quantitative local texture information in damascene copper interconnects (1.8 µm–70 nm in width) with a spatial resolution of less than 5 nm. Misorientation and trace analysis is performed to investigate the grain boundary distribution in these lines. The results reveal strong variations in texture and grain boundary distribution of the copper lines upon downscaling. Lines of width 1.8 µm exhibit a strong 〈111〉 normal texture and comprise large micron-size grains. Upon downscaling to 180 nm, a {111}〈110〉 bi-axial texture has been observed. In contrast, narrower lines of widths 120 and 70 nm reveal sidewall growth of {111} grains and a dominant 〈110〉 normal texture. The microstructure in these lines comprises clusters of small grains separated by high angle boundaries in the vicinity of large grains. The fraction of coherent twin boundaries also reduces with decreasing line width.

Atomic Structure of a Lithium-Rich Layered Oxide Material for Lithium-Ion Batteries: Evidence of a Solid Solution

Li[Li0.2Ni0.2Mn0.6]O2, which is a cathode material for Li-ion batteries with enhanced capacity, has been examined, for the first time, with a combination of aberration-corrected scanning transmission electron microscopy (STEM), STEM computer simulations, and diffraction scanning transmission electron microscopy (D-STEM). These techniques, in combination with X-ray diffraction (XRD) and conventional electron diffraction (ED), indicate that this material is composed of a solid solution with C2/m monoclinic symmetry and multiple planar defects. In addition, we show that XRD and ED alone can give misleading information and cannot resolve the structure of these materials without the additional use of the aforementioned techniques.

Site-Specific Deposition of Au Nanoparticles in CNT Films by Chemical Bonding

There has been no attempt to date to specifically modify the nodes in carbon nanotube (CNT) networks. If the nodes can be modified in favorable ways, the electrical and/or thermal and/or mechanical properties of the CNT networks could be improved. In an attempt to influence the performance as a transparent conductive film, gold nanoparticles capped with the amino acid cysteine (Au-CysNP) have been selectively attached at the nodes of multiwalled carbon nanotubes (MWCNTs) networks. These nanoparticles have an average diameter of 5 nm as observed by TEM. FTIR and XPS were used to characterize each step of the MWCNT chemical functionalization process. The chemical process was designed to favor selective attachment at the nodes and not the segments in the CNT networks. The chemical processing was designed to direct formation of nodes where the gold nanoparticles are. The nanoparticles which were loosely held in the CNT network could be easily washed away by solvents, while those bound chemically remained. TEM results show that the Cys-AuNPs are preferentially located at the nodes of the CNT networks when compared to the segments. These nanoparticles at the nodes were also characterized by a novel technique called diffraction scanning transmission electron microscopy (D-STEM) confirming their identity. Four-probe measurements found that the sheet resistance of the modified CNT networks was half that of similarly transparent pristine multiwalled CNT networks.

Catalyst‐Free Synthesis and Characterization of Metastable Boron Carbide Nanowires

AbstractCatalyst‐free growth of boron carbide nanowires is achieved by pyrolysis of diborane and methane at 650–750 °C and around 500 mTorr in a quartz tube furnace. Electron‐diffraction analysis using a novel diffraction‐scanning transmission electron microscopy (D‐STEM) technique indicates that the crystalline nanowires are single‐crystal orthorhombic boron carbide. TEM images show that the nanowires are covered by a 1–3 nm thick amorphous layer of carbon. Elemental analysis by electron energy loss spectroscopy (EELS) shows only boron and carbon while energy‐dispersive X‐ray spectroscopy (EDX) and X‐ray photoelectron spectroscopy (XPS) show the presence of oxygen as well as boron and carbon.