Dielectric Loss Of Films Research Articles

Correlation of sputtering power with microstructure and ionic conductivity in lithium aluminum oxide thin films prepared by reactive co-sputtering

Li–Al–O thin films synthesized via the reactive magnetron co-sputtering have the potential to act as solid-state electrolytes in micro-batteries. In this paper, the constant RF power (155 W) and variable DC power (20–50 W) were applied to lithium (Li) and aluminum (Al) metal targets, respectively, in Ar/O2 atmosphere to produce films with adequate ionic conductivity. The influence of DC sputtering power on the composition, microstructure, band gap energy, ionic conductivity, and dielectric loss of films were studied in detail. X-ray photoelectron spectroscopy (XPS) showed a shift of the Li 1s peak towards higher binding energy with increasing DC power. X-ray diffraction (XRD) spectra confirmed the amorphous state for all as-deposited films, while the post-annealed films at 950 °C contain the γ-LiAlO2 phase. Field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) images revealed that the increasing DC power had a significant impact on the film morphology, enlarging grain size and increasing surface roughness. Energy dispersive X-ray (EDX) spectroscopy showed that increasing the DC power increased the Al content. The optical properties were examined by ultraviolet–visible (UV–vis) spectroscopy, which indicated that increasing the Al content led to a blue shift of the absorption edge and an increase in the band gap energy (5.40–5.68 eV). Increasing the DC power resulted in an improvement of room-temperature conductivity by two orders of magnitude (∼2.85 × 10−9 S cm−1) and a decrease in the activation energy from 0.54 eV to 0.32 eV. These results suggest that composition and microstructure significantly affect the ionic transport in co-sputtered Li–Al–O films.

Flexible magnetic copolymer films with high decomposition temperature and stable dielectric properties

Two novel kinds of flexible magnetic copolymer films were prepared via copolymerization using magnetic ferrocenyl prepolymer (MFP) and poly(arylene ether nitrile)s with bisphthalonitrile functional group. Two types of poly(arylene ether nitrile)s with bisphthalonitrile functional group were used and two series of flexible magnetic copolymer film with different structure were obtained. The magnetic properties of copolymer films indicated that the films were soft magnetic. Moreover, it was also concluded that the magnetic properties of magnetic films prepared from phthalonitrile terminated poly(arylene ether nitrile)s were higher than that of magnetic films prepared from poly(arylene ether nitrile)s with pendant phthalonitriles at the same content of MFP. The results of thermogravimetry showed that the all of the copolymer films possessed high decomposition temperature. Like the magnetism, the dielectric constant and dielectric loss of films obtained from phthalonitrile terminated poly(arylene ether nitrile)s were also higher than that of films obtained from poly(arylene ether nitrile)s with pendant phthalonitriles.

Fabrication and Characterization of BaxSr1-xTiO3/YBa2Cu3Ox/SrTiO3 Structure

BaxSr1-xTiO3 (BST)/YBa2Cu3Ox (YBCO)/SrTiO3 (STO) structures were deposited, and the microstructure, orientation and electrical characteristics were investigated. (00l) oriented YBCO thin films were deposited on STO substrates using pulsed laser deposition, and (h00) oriented BST thin films were deposited on YBCO/STO substrates using electron cyclotron resonance (ECR) plasma assisted metal organic chemical vapor deposition (MOCVD). A new phase was formed at the interface between YBCO and BST films and was speculated to be (BaxY1-x)(TiyY1-y)O3. Ba-rich BST films showed a higher dielectric loss than Sr-rich BST films did, which indicates that Sr-rich BST films are more suited for application to microwave devices. The dielectric loss of the films was reduced as temperature decreased, which may be due to the conductivity change of YBCO film and the formation of a conduction path rather than a dielectric property change of the BST film itself. The capacitance vs voltage and the dielectric loss vs bias voltage curves of BST film showed a polarity dependence, which may be speculated to be because of the barrier height difference between the interfaces.

Dielectric and pyroelectric properties of nylon 5,7 as a function of molecular orientation

Abstract Nylon 5,7 has been made in film form with two different molecular orientations. X-ray studies show that the H-bonds in rolled and annealed Nylon 5,7 are oriented approximately perpendicular to the film surface. Because of this, the film has a low dielectric response and reasonably high pyroelectric response. In gold nucleated, directionally crystallized Nylon 5,7 the H-bonds are oriented parallel to the film surface. Such films have a high dielectric response and low pyroelectric response. This can be understood in the light of the proposed model of H-bond twinning. The disappearance of the alpha relaxation in film A was ascribed to pinning of the amorphous phase since the oriented film was annealed under tension. High temperature dielectric loss of film A follows Jonscher's power law with n close to 1 showing that it is probably due to ionic conduction. Dielectric loss in film B gives an n value of 0.30 in the temperature range of 130–160°C, indicating that much of the loss is not due to ionic c...

Dielectric loss in thin films of insulating liquids

This paper describes theoretical and experimental work on the dielectric loss of films of insulating liquids so thin that the motion of ions under an alternating field is limited by the boundaries of the film. Films of this thickness normally occur in porous, impregnated insulation, and lead to a dielectric loss angle which varies greatly with the applied stress. In Section (2) of the paper approximate equations are established for the dielectric loss of such a thin film, as a function of the applied stress. It is also shown that measurements on thin films afford a new method of deducing the ionic concentration, radius and mobility. In Section (3) experimental work is described upon films of an insulating liquid (trichlorbenzene) as thin as 0.03 mm. Such films show a large variation of loss angle with stress, agreeing closely with the predicted variation, except in one or two cases where the nature of the ionized impurities appeared to be abnormal. Values of ionic radius and mobility deduced from the equations of Section (2) check well with values known from electrolytic measurements. It is concluded that experiment confirms the theory put forward, except at very low stresses, where assumptions made in the theory are no longer valid. In Section (4) the equations of Section (2) are applied to an actual impregnated dielectric with non-uniform pore sizes, and it is shown that provided account is taken of the distribution of pore sizes, the theory will account satisfactorily for the variation with stress of the loss angle of condensers impregnated with liquids containing ionized impurities. Values of ionic radius and mobility deduced from these results are also of the right order of magnitude, but are less accurate than those obtained in Section (3), owing to lack of knowledge of the exact distribution of pore sizes. Detailed conclusions are given at the end of the paper.