Detection Of Pattern Sensitive Faults Research Articles

The repeated nondestructive march tests with variable address sequences

Random access memory testing by repeated application of march tests was examined. The sequence of addresses formed in each test phase with the constant test structure was used as a variable parameter. The method of the modified address sequences formation is proposed. As a difference measure of the modified address sequences arithmetic distance is used. The efficiency of detection of pattern sensitive faults is estimated depending on modification of the address sequences and their arithmetic distances.

Test generation for pattern-sensitive faults in integrated switches

The problem of pattern-sensitive fault detection in integrated time-division switches is discussed. It is shown that high fault coverage can be obtained by applying random test vectors produced by a maximum-length linear feedback shift register. Two tester architecture solutions are proposed. >

Fault coverage of pattern-sensitive fault-detection algorithms for semiconductor memories

Experimental studies have been made on the fault coverage of pattern-sensitive fault-detection algorithms proposed for semiconductor memories. The experiment is carried out on a microprocessor-based system. A comparative study has been made based on the experimental results.