Microscopy Research and TechniqueVolume 43, Issue 6 p. 518-519 Characterization of etch pits and correlated defects in ZnSe/(001)GaAs Shigeyasu Tanaka, Corresponding Author Shigeyasu Tanaka Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanDept. of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.Search for more papers by this authorTomohiro Goto, Tomohiro Goto Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanSearch for more papers by this authorMichio Hibino, Michio Hibino Center for Integrated Research in Science and Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanSearch for more papers by this author Shigeyasu Tanaka, Corresponding Author Shigeyasu Tanaka Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanDept. of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan.Search for more papers by this authorTomohiro Goto, Tomohiro Goto Department of Electronics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanSearch for more papers by this authorMichio Hibino, Michio Hibino Center for Integrated Research in Science and Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, JapanSearch for more papers by this author First published: 29 December 1998 https://doi.org/10.1002/(SICI)1097-0029(19981215)43:6<518::AID-JEMT5>3.0.CO;2-0AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat No abstract is available for this article. Volume43, Issue615 December 1998Pages 518-519 RelatedInformation