In this study, we demonstrate the effects of electron velocity modulation (Δve/ΔVgs) on the microwave power performance for AlGaN/GaN HFETs. In order to conduct the experiments, AlGaN/GaN HFETs with gate lengths ranging from 500 to 80 nm were fabricated. Electron transport was investigated by coupling a drift-diffusion solver with the Monte Carlo method. As gate lengths (Lg) varied from 500 to 200 nm, the increased polarization Coulomb field scattering led to an increase in Δve/ΔVgs and the stronger electric field (E) increased ve and enhanced the transconductance (gm), which in turn led to a greater power gain (Gp) in the HFETs. The higher power output (Pout) was also due to the increased ve that boosted the saturated output current (Ids,sat). The unique phenomenon that occurs from electron velocity modulation of AlGaN/GaN HFETs at electron densities (ns) < 3.42 × 1012cm−2 can be used as an effective mechanism to enhance the power gain of AlGaN/GaN HFETs.
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