Computer-aided Inspection Planning System Research Articles

A frame for a computer aided inspection planning system

Coordinate Measuring Machine (CMM) inspection planning is an activity performed by well-trained operators, but different measurement techniques, using the same data analysis algorithms yield in different measurement results. This is a well-recognized source of uncertainty in coordinate measurement. A CMM, provided with an automatic inspection planning (CAIP) system, permits to implement more accurate and efficient operating procedures and to fit higher quality assurance standards and tighter production timings.In this paper we present a frame of a CAIP system, able to deal with almost all the decisional stages of CMM inspection. Moreover, original approaches have been developed and presented in inspection feature selection, part set-up, probe configuration, and path planning.

Development of Computer Aided Inspection Planning (CAIP) Application in on Machine Measurement Operation (OMM) Operations for Box Primitive Features: Generating Inspection Codes

The aims of this research is to develop a Computer Aided Inspection Planning (CAIP) system in OMM operations which has an ability to measure workpieces automatically at a machine tools based on drawing data issued by the design division. The information that can be used to build a CAIP system is a feature. Therefore, a feature reconstruction process is necessary based on the data STEP geometry information. The Feature types used in this research is a type of box primitive feature. A Probe, a measuring instrument, can be operated in CMM (Coordinate Measurement Machine) and CNC machine. A product measuring on CNC machine during or after machining process called OMM (On Machine Measurement) operation. As a result, measuring can be performed without moving the product from the machine. In this research, 5 Axis CNC machine with Heidenhain DMU150 iTNC530 controller is used.

Study on On-Machine Inspection Technology of Machining Center Based

With the development of digitalized manufacturing (DM), on-machine inspection (OMI) has become the key link of integrated quality system in DM. In DM, The detection and monitoring system chiefly dealing with kinds of parameters in machining process, taking on-line detection, analyzing the process quality information and carrying out corresponding quality assurance, so the quality of product may be assured and DM can be run in good condition. Therefore, the OMI technology of machining center based is researched. The framework of OMI and the hardware structure of special driving card for probe or tool (SDCPT) are described. Computer aided inspection planning (CAIP) is the integration bridge between CAD/CAM and computer aided inspection. A feature-based CAIP system for OMI is proposed to inspect the complicated mechanical parts efficiently during machining or after machining. The CAIP system is designed to produce an inspection process planning directly from CAD model. The prototype CAIP system includes the tolerance feature analysis, accessibility analysis, feature identification, measurement planning, and collision detection. The CAIP system can minimize the number of part setups and probe orientations and the inspection feature sequence.

A computer-aided inspection planning system for on-machine measurement — part I: Global inspection planning —

Computer-Aided Inspection Planning (CAIP) is the integration bridge between CAD/CAM and Computer Aided Inspection (CAI). A CAIP system for On-Machine Measurement (OMM) is proposed to inspect the complicated mechanical parts efficiently during machining or after machining. The inspection planning consists of Global Inspection Planning (GIP) and Local Inspection Planning (LIP). In the GIP, the system creates the optimal inspection sequence of the features in a part by analyzing the various feature information such as the relationship of the features, Probe Approach Directions (PAD), etc. Feature groups are formed for effective planning, and special feature groups are determined for sequencing. The integrated process and inspection plan is generated based on the sequences of the feature groups and the features in a feature group. A series of heuristic rules are developed to accomplish it. In the LIP of Part II, the system generates inspection parameters. The integrated inspection planning is able to determine optimum manufacturing sequence for inspection and machining processes. Finally, the results are simulated and analyzed to verify the effectiveness of the proposed CAIP.