Clocked Storage Elements Research Articles

Review of Clocked Storage Elements in Digital Circuit Design

Storage of digital circuit is "state" or memory. These are called sequential circuits. The most fundamental sequential circuit type that we will ponder is known as the Flip-Flop. It is ponder four distinct assortments of these gadgets and their utilization in registers and register documents, which can be considered as one type of on– CPU memory. The traditional memory, called RAM, is ordinarily not on the CPU chip. Regular Slam and its assortments, including RAM, ROM, SRAM, Measure, and SDRAM. True single-phase clock (TSPC) method of reasoning has found wide use in advanced plan. At first as a quick topology, the TSPC structure in like manner eats up less power and includes less areas than various systems. In flip-flop plan only a single transistor is being clocked by short heartbeat get ready which is known as True Single Phase Clocking (TSPC) flip-flop.

POWER7™, a Highly Parallel, Scalable Multi-Core High End Server Processor

This paper gives an overview of the latest member of the POWER™ processor family, POWER7™. Eight quad-threaded cores, operating at frequencies up to 4.14 GHz, are integrated together with two memory controllers and high speed system links on a 567 mm die, employing 1.2B transistors in a 45 nm CMOS SOI technology with 11 layers of low-k copper wiring. The technology features deep trench capacitors which are used to build a 32 MB embedded DRAM L3 based on a 0.067 m DRAM cell. The functionally equivalent chip transistor count would have been over 2.7B if the L3 had been implemented with a conventional 6 transistor SRAM cell. (A detailed paper about the eDRAM implementation will be given in a separate paper of this Journal). Deep trench capacitors are also used to reduce on-chip voltage island supply noise. This paper describes the organization of the design and the features of the processor core, before moving on to discuss the circuits used for analog elements, clock generation and distribution, and I/O designs. The final section describes the details of the clocked storage elements, including special features for test, debug, and chip frequency tuning.

Oblique Memory Array Design Method

In this paper, we propose an efficacious memory array design method for low temperature poly-silicon technique. According to the four steps of our suggested method, we can draw a regular layout form of memory array. The regular property allows both ready calculation of the layout area and easy design of the memory controller. Since our proposed method does not leave any gaps in our layout, it is a powerful way to save area in the LTPS technique. It is also suitable for an electronic design automation (EDA) tool to implement a memory compiler with systematic and required size memory IP. Since the true single phase clock (TSPC) master-slave latch (MSL) is a fast and simple structure to implement a clocked storage element, we use TSPC-MSL as our memory cells to increase working frequency by a wide margin. Furthermore, according to our oblique memory array design method, we propose a verification formula to double-check whether our design is optimal or not at any time.

The Effect of the System Specification on the Optimal Selection of Clocked Storage Elements

This paper represents a departure from the conventional methods of design and analysis of clocked storage elements that rely on minimizing a fixed energy-delay metric. Instead it establishes a systematic comparison in the energy-delay design space based on the parameters of the surrounding blocks. We define the composite energy-efficient characteristic over all storage element topologies and identify the most efficient storage element depending on its position on the composite characteristic relative to other topologies within a pipeline stage. Thus, we show that an optimal design could use a mixed variety of clocked storage elements (CSEs) depending on their placement in the pipeline and critical path. Since a well-designed system has hardware intensities balanced for a given cycle, a CSE choice will be made depending on the pipeline and path intensities. We show that a meaningful comparison can be carried out only by acknowledging that the optimal design and choice of the clocked storage elements depends heavily on the application, and by analyzing the energy and delay of the clocked storage elements in context of this application. The analysis in the energy-delay space allows us to understand some intuitive design choices in a quantitative way and to identify the optimal storage element topologies for an arbitrary system specification

A test circuit for measurement of clocked storage element characteristics

We present a method, on-chip test circuitry, and an error analysis, for accurate measurement of timing characteristics and power consumption of clocked storage elements. The test circuit was fabricated in 0.11 /spl mu/m CMOS technology and the measurements performed automatically using a serial scan interface. The precision and accuracy of the presented method are demonstrated by the ability to measure entire clock-to-output characteristics of flip-flops. Estimated data-to-output delay systematic measurement error is 6 ps (7%), and random error is 10 ps (11%). The method and the test circuit are applicable for delay measurements of other circuit blocks as well.

Clocking and clocked storage elements in a multi-gigahertz environment

Clocking considerations and the design of clocked storage elements are discussed in this paper. We present a systematic approach for deriving a clocked storage element suitable for time borrowing and absorption of clock uncertainties. We explain how to compare different clocked storage elements with each other, and discuss issues related to power consumption and low-power designs. Finally, results of comparisons among representative designs are presented.

Clocking in multi-GHz environment

An overview of clocking and design of clocked storage elements is presented. Systematic design of ip-op is explained as well as "time borrowing" and absorption of clock uncertainties. We show how should different clocked storage elements be compared against each other. The issues related to power consumption and low-power design are presented.

Doppler shift viewed as a result of variable delay

Doppler is presented as the consequence of variable delay. The general Doppler shift equation is derived in a way that can be applied to any waveform having ‘‘frequency.’’ The waveform need not be sinusoidal. Comments on laboratory methods of creating Doppler using clocked storage elements are included. The results of an experiment are stated.