Platinum telluride (PtTe2), as a newly emerged type II Dirac semimetal, has attracted much attention. Due to its excellent linear dispersive band structure and ultra-high carrier mobility, PtTe2 show great potential in the new quantum phenomena, topological phase transitions, unconventional superconductivity and other photodetecting fields. In this paper, we report the negative photoelectric effect of photodetectors based on the type II Dirac semimetal PtTe2 film under the laser irradiation of 405 nm, 532 nm and 808 nm. Under the condition of applying 1 V voltage, the R of the PtTe2 device under 405 nm laser irradiation was 20 A/W and the D* was 6.9×109 Jones; the R of the PtTe2 device under 532 nm laser irradiation was 1.3 A/W and the D* was 4.1×108 Jones; the R of the PtTe2 device under 808 nm laser irradiation was 0.6 A/W and the D* was 2.1×108 Jones. Under normal atmospheric pressure and room temperature conditions, we observed a negative photoconductivity phenomenon for the PtTe2 device, where the change in photoconductivity is attributed to the light-induced desorption of O or H2O molecules from the surface of the material. In addition, a single-site scanning imaging system based on a PtTe2 photodetector was designed to test the detection capability of the device. The analysis of the photocurrent effect produced by the PtTe2 device further deepens the understanding of the photoconductivity mechanism in the field of photodetection.
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