Beryllium Compound Refractive Lenses Research Articles

Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highly coherent source is used, but has not been demonstrated with partial coherence due to the multi-modal probe required. Here, we demonstrate that partial coherence can be accounted for in ptychographic reconstructions using the multi-modal approach and assuming that decoherence arises from either the probe or the object. This equivalence recovers coherent (or single state) reconstructions of both the probe and the object even in the presence of partial coherence. We demonstrate this experimentally by using hard x-ray ptychography with a partially coherent source to image a Siemens star test object and to also recover the wavefront error from an aberrated beryllium compound refractive lens. The source properties and resolving capabilities are analyzed, and the wavefront error results are compared with another at-wavelength metrology technique. Our work demonstrates the capability of ptychography to provide high-resolution imaging and optics characterization even in the presence of partial coherence.

Hard X-ray ptychography for optics characterization using a partially coherent synchrotron source.

Ptychography is a scanning coherent diffraction imaging technique which provides high resolution imaging and complete spatial information of the complex electric field probe and sample transmission function. Its ability to accurately determine the illumination probe has led to its use at modern synchrotrons and free-electron lasers as a wavefront-sensing technique for optics alignment, monitoring and correction. Recent developments in the ptychography reconstruction process now incorporate a modal decomposition of the illuminating probe and relax the restriction of using sources with high spatial coherence. In this article a practical implementation of hard X-ray ptychography from a partially coherent X-ray source with a large number of modes is demonstrated experimentally. A strongly diffracting Siemens star test sample is imaged using the focused beam produced by either a Fresnel zone plate or beryllium compound refractive lens. The recovered probe from each optic is back propagated in order to plot the beam caustic and determine the precise focal size and position. The power distribution of the reconstructed probe modes also allows the quantification of the beams coherence and is compared with the values predicted by a Gaussian-Schell model and the optics exit intensity.

Micro-focused MHz pink beam for time-resolved X-ray emission spectroscopy.

The full radiation from the first harmonic of a synchrotron undulator (between 5 and 12 keV) at the Advanced Photon Source is microfocused using a stack of beryllium compound refractive lenses onto a fast-moving liquid jet and overlapped with a high-repetition-rate optical laser. This micro-focused geometry is used to perform efficient nonresonant X-ray emission spectroscopy on transient species using a dispersive spectrometer geometry. The overall usable flux achieved on target is above 1015 photons s-1 at 8 keV, enabling photoexcited systems in the liquid phase to be tracked with time resolutions from tens of picoseconds to microseconds, and using the full emission spectrum, including the weak valence-to-core signal that is sensitive to chemically relevant electronic properties.

Wavefront sensing at X-ray free-electron lasers.

Here a direct comparison is made between various X-ray wavefront sensing methods with application to optics alignment and focus characterization at X-ray free-electron lasers (XFELs). Focus optimization at XFEL beamlines presents unique challenges due to high peak powers as well as beam pointing instability, meaning that techniques capable of single-shot measurement and that probe the wavefront at an out-of-focus location are desirable. The techniques chosen for the comparison include single-phase-grating Talbot interferometry (shearing interferometry), dual-grating Talbot interferometry (moiré deflectometry) and speckle tracking. All three methods were implemented during a single beam time at the Linac Coherent Light Source, at the X-ray Pump Probe beamline, in order to make a direct comparison. Each method was used to characterize the wavefront resulting from a stack of beryllium compound refractive lenses followed by a corrective phase plate. In addition, difference wavefront measurements with and without the phase plate agreed with its design to within λ/20, which enabled a direct quantitative comparison between methods. Finally, a path toward automated alignment at XFEL beamlines using a wavefront sensor to close the loop is presented.

High-Resolution Phase-Contrast Imaging at XFELs

We built an x-ray microscope for the Matter in Extreme Conditions (MEC) endstation of the LCLS, which is especially adapted to the XFEL environment, and used the setup to carry out different experiments based on magnified x-ray phase-contrast imaging. The method allows one to image a sample with high spatial resolution and high sensitivity to small density changes within a sample. The xray microscope is based on a set of Beryllium compound refractive lenses (Be-CRLs) creating a secondary x-ray source closely in front of a sample. The sample is positioned in the divergent x-ray beam and a CCD detector records a magnified image of the illuminated area at a larger distance further downstream [cf. Fig. 1 a)]. In a pump-probe scheme an optical laser hits the sample from the side, which initiates a shock wave propagating into the material, and the XFEL pulse probes the state of the material shortly after. In Figs. 1 b) – 1 e) a series of measured phase-contrast images recorded on Kapton at diff t delay times between the optical and XFEL pulse is shown. Larger features such as the position of the shock front and structures behind it can be observed directly in the image. However, due to diffraction effects it is necessary to evaluate the phase-contrast images numerically using phase retrieval methods in order to obtain high-resolution images of the sample. In addition, a quantitative analysis requires a precise knowledge of the illumination wave fi to disentangle features already present in the incoming x-ray beam from the actual object. Beam characterization was carried out using scanning coherent x-ray microscopy (ptychography). The method yields the wave fi distribution of the nano-focused XFEL beam with high spatial resolution (cf. Fig. 2) [3, 4]. In this contribution we report on current activities to implement high-resolution x-ray imaging at the Linac Coherent Light Source (LCLS) [5]. We demonstrate these new capabilities at the example of imaging of shock waves in different materials, outline the analysis procedure and discuss limitations related to fluctuations in beam intensity and position, bandwidth of the XFEL beam [6] and dispersive properties of the x-ray optics.

Experimental characterization of X-ray transverse coherence in the presence of beam transport optics

A simple Boron fiber based interference scheme [1] and other similar schemes are currently routinely used for X-ray coherence estimation at 3rd generation synchrotron radiation sources. If such a scheme is applied after a perfect monochromator and without any focusing / transport optics in the optical path, the interpretation of the measured interference pattern is relatively straightforward and can be done in terms of the basic parameters of the source [2]. However, if the interference scheme is used after some focusing optics, e.g. close to the X-ray beam waist, the visibility of fringes can be significantly affected by the new shape of the focused beam phase-space. At the same time, optical element imperfections still have a negative impact on the transverse coherence. In such situations, which are frequently encountered in experiments at beamlines, the quantitative interpretation of a measured interference pattern is not straightforward. Here we show that this can nevertheless be done by using partially-coherent synchrotron radiation wavefront propagation simulations. The results obtained from measurements, performed at the 32-ID undulator beamline of the Advanced Photon Source, and wavefront propagation based simulations show, in particular, that new generation 1D Beryllium Compound Refractive Lenses [3, 4] do not reduce the X-ray transverse coherence in any significant manner.

Thermo-mechanical analyses of beryllium compound refractive lens for NSLS-II beamline

In this paper we discuss the finite-element analysis (FEA) of a one-dimensional beryllium compound refractive lens (Be-CRL) that was undertaken to study the feasibility of installing the CRL in the Inelastic X-ray Scattering (IXS) beamline of National Synchrotron Light Source-II (NSLS-II) (a new state-of-the-art medium-energy third-generation storage ring). The current insertion device for this beamline is an IVU22-6m in-vacuum planar undulator delivering a total power of ~9 kW with a peak power density of ~90 kW/mrad2. Through analysis, based on calculation of spectral angular distribution of undulator radiation from IVU22, we determined that it is essential to install a 30 µm graphite filter upstream of the CRL in order to restrict the temperature rise in the CRL to 65°C for acceptable thermal strain.

Small angle x-ray scattering with a beryllium compound refractive lens as focusing optic

At BW4 at HASYLAB a beryllium compound refractive lens (Be-CRL) is used for the focusing in small-angle x-ray scattering experiments. Using it provides the advantages of higher long-term stability and a much easier alignment compared to a setup with focusing mirrors. In our investigations presented here, we show the advantages of using a Be-CRL in small-angle and also ultra small-angle x-ray scattering. We investigated the beam characteristics at the sample position with respect to spot size and photon flux. The spot size is comparable to that of a setup with focusing mirrors but with a gain in flux and better long-term stability. It is also shown that plane mirrors are still necessary to suppress higher order energies passing the monochromator.

Small-angle options of the upgraded ultrasmall-angle x-ray scattering beamline BW4 at HASYLAB

We present the upgrade and present status of the ultrasmall-angle x-ray scattering (USAXS) beamline BW4 at the Hamburg Synchrotronstrahlungslabor. In order to extend the accessible scattering vector range, new small-angle setups have been established, making use of the high flux and small divergence of BW4. In standard transmission geometry using a beam size of B=400×400μm2 (horizontal×vertical), typical small-angle resolution ranges from dmax=90to650nm, depending on sample-to-detector distance. Additionally a new microfocus option has been established. This microfocus option allows reducing the sample size by one order of magnitude. Using parabolic beryllium compound refractive lenses, a new standard beam size of B=65×35μm2 (horizontal×vertical) can be provided. The μ-SAXS resolution is as high as dmax=150nm. Using μ-SAXS in combination with grazing incidence (μ-GISAXS) on a standard noble metal gradient multilayer, we prove the feasibility of μ-GISAXS experiments at a second generation source.

Large aperture compound lenses made of lithium

We have measured the intensity profile and transmission of x rays focused by a series of biconcave parabolic unit lenses fabricated in lithium. For specified focal length and photon energy lithium compound refractive lenses (CRL) have a larger transmission, aperture size, and gain compared to aluminum, kapton, and beryllium CRLs. The lithium compound refractive lens was composed of 335 biconcave, parabolic unit lenses each with an on-axis radius of curvature of 0.95 mm. Two-dimensional focusing was obtained at 8.0 keV with a focal length of 95 cm. The effective aperture of the CRL was measured to be 1030 μm with on-axis (peak) transmissions of 27% and an on-axis intensity gain of 18.9.

A water-cooled compound refractive lens as a white beam collimator

A white beam collimator has been built to increase the efficiency of a diamond high-heat-load premonochromator. The collimator is composed of a water-cooled beryllium compound refractive lens. We demonstrate a 30% increase in spectral flux of the diamond premonochromator (at 22.6 keV) by using the collimator.