A typical diffraction experiment yields several pictures and datasets from various crystals within a brief timeframe. This poses a barrier for the efficient operation of advanced synchrotron beamlines and the following data processing. Novice users, in particular, may have a sense of being inundated by the tables, graphs, and numerical information that is provided to them via different data-processing systems and software packages. Here, we outline many common obstacles that users face while processing a collection of photos to generate a processed dataset. Our main emphasis is on the challenges that often occur while transitioning from the earliest phases of converting experimental data collecting into an interpreted electron density model. Examining certain data properties during processing may frequently help solve or identify challenges such as unforeseen crystal formations, issues with crystal manipulation, and suboptimal selection of data-collection techniques. Ultimately, it is important to distinguish between concerns that are beyond of one's immediate control after the experiment has concluded and those that can be dealt with later. Presenting auto PROC, an innovative software solution that combines external processing packages with new tools and an automated workflow script. This program is designed to help users effectively handle data that is impacted by the issues outlined above. It specifically focuses on automating the processing of multi-sweep data sets produced from multi-axis gonio metrics. It offers consumers both instruction and important insights into the processing of data that is not done online.