Atomic Force Microscope System Research Articles

Multi-view neural 3D reconstruction of micro- and nanostructures with atomic force microscopy

Atomic Force Microscopy (AFM) is a widely employed tool for micro- and nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro- and nanostructures precisely due to limitations such as incomplete sample topography capturing and tip-sample convolution artifacts. Here, we propose a multi-view neural-network-based framework with AFM, named MVN-AFM, which accurately reconstructs surface models of intricate micro- and nanostructures. Unlike previous 3D-AFM approaches, MVN-AFM does not depend on any specially shaped probes or costly modifications to the AFM system. To achieve this, MVN-AFM employs an iterative method to align multi-view data and eliminate AFM artifacts simultaneously. Furthermore, we apply the neural implicit surface reconstruction technique in nanotechnology and achieve improved results. Additional extensive experiments show that MVN-AFM effectively eliminates artifacts present in raw AFM images and reconstructs various micro- and nanostructures, including complex geometrical microstructures printed via two-photon lithography and nanoparticles such as poly(methyl methacrylate) (PMMA) nanospheres and zeolitic imidazolate framework-67 (ZIF-67) nanocrystals. This work presents a cost-effective tool for micro- and nanoscale 3D analysis.

Linearizing AFM raster scans acquired using dual-stage lateral scanners

Dual-stage scanners can successfully increase the range of atomic force microscope (AFM) scanners in space and/or frequency by designing and constructing two nanopositioners with significant differences in static and dynamic characteristics. In such cases, the positioning signal has to be split to meet the displacement and frequency limitations of each stage. Without closed-loop displacement measurement sensors, linearizing images acquired using signals split in time and frequency can be challenging. A common method, often cumbersome and time consuming, uses inverse model-based feedforward compensation. In this work, we show that image-based linearization can be used to achieve acceptable results for raster scans acquired using dual-stage scanners. In particular, we apply the feedforward and image-based methods to our homemade dual-stage lateral scanner and high-speed AFM (HS-AFM) system. The acquired scans compare well for the two methods, indicating that image-based raster scan linearization can be used in place of inverse model-based feedforward approaches.

Atomic force microscopy monitoring of subcritical slow crack growth in soda lime silicate glass

Prediction of brittle fracture in silicate glasses requires a fundamental understanding of slow crack growth rates, far below the critical stress intensity (KIC) of the material. Here, atomic force microscopy (AFM) was used to characterize slow crack propagation in soda lime silicate glasses. Using large-sample AFM systems with specialized tips and scanners, fractures less than 20 nm wide were measured as a function of relative humidity (RH). The results were found to be sensitive to the type of AFM tip used and to the dryness of the surface. Continuous scanning and image capture over several days allowed the determination of the crack tip velocity. The dependance of crack tip velocity on RH was measured by enclosing the sample and AFM head in a humidity-controlled chamber. The crack tip velocity was measured as low 4.0×10-12 m/s at 15 % RH and as high as 3.7×10-10 m/s at 40 % RH. Overall crack growth was smooth during the AFM scan. Additionally, recession of the crack tip was noted as the sample dried, indicating crack tip closure may be occurring. Further studies on alternative compositions will provide details on subcritical fracture processes in a range of different environmental conditions.

Experimental setup for thermal measurements at the nanoscale using a SThM probe with niobium nitride thermometer.

Scanning Thermal Microscopy (SThM) has become an important measurement technique for characterizing the thermal properties of materials at the nanometer scale. This technique requires a SThM probe that combines an Atomic Force Microscopy (AFM) probe and a very sensitive resistive thermometer; the thermometer being located at the apex of the probe tip allows for the mapping of temperature or thermal properties of nanostructured materials with very high spatial resolution. The high interest of the SThM technique in the field of thermal nanoscience currently suffers from a low temperature sensitivity despite its high spatial resolution. To address this challenge, we developed a high vacuum-based AFM system hosting a highly sensitive niobium nitride (NbN) SThM probe to demonstrate its unique performance. As a proof of concept, we utilized this custom-built system to carry out thermal measurements using the 3ω method. By measuring the V3ω voltage on the NbN resistive thermometer under vacuum conditions, we were able to determine the SThM probe's thermal conductance and thermal time constant. The performance of the probe is demonstrated by performing thermal measurements in-contact with a sapphire sample.

Development of a Bio-Hybrid Mosquito Stinger-Based Atomic Force Microscopy Probe.

Mosquitoes, notorious as the deadliest animals to humans due to their capacity to transmit diseases, pose a persistent challenge to public health. The primary prevention strategy currently in use involves chemical repellents, which often prove ineffective as mosquitoes rapidly develop resistance. Consequently, the invention of new preventive methods is crucial. Such development hinges on a thorough understanding of mosquito biting behaviors, necessitating an experimental setup that accurately replicates actual biting scenarios with controllable testing parameters and quantitative measurements. To bridge this gap, a bio-hybrid atomic force microscopy (AFM) probe was engineered, featuring a biological stinger - specifically, a mosquito labrum - as its tip. This bio-hybrid probe, compatible with standard AFM systems, enables a near-authentic simulation of mosquito penetration behaviors. This method marks a step forward in the quantitative study of biting mechanisms, potentially leading to the creation of effective barriers against vector-borne diseases (VBDs) and opening new avenues in the fight against mosquito-transmitted illnesses.

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline.

Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM-XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF-STXM-AFM combination.

Silica nanoparticle-membrane interactions investigated by atomic force microscopy in an organic solvent

Ion-exchange membranes have been widely used not only in water but also in organic solvents for both scientific exploration and industrial applications. Atomic force microscopy (AFM) is a promising analytical technique to determine membrane functions in both water and organic solvents. Nevertheless, the use of organic solvents frequently causes significant contamination and mechanical drift in AFM imaging investigations. Additionally, the rapid evaporation of organic solvents imposes the limitation of measurement time. Thus, a force curve array measurement requiring a longer time is challenging in organic solvents. Herein, we propose a widely adaptable holder design that facilitates stable AFM measurements in organic solvents for a broad range of AFM systems. Using the designed AFM holder, we investigated silica-membrane interactions in 2-propanol. Our AFM evaluation provides important information on nanoparticle removal with ion-exchange membranes in 2-propanol. The concept of widely adaptable holder design should contribute to the understanding of nanoparticle-membrane interactions and the development of various functional membranes used in organic solvents.

Nanoscopic lignin mapping on cellulose nanofibers via scanning transmission electron microscopy and atomic force microscopy

Cellulose has been developed as an alternative to petrochemical materials. By comparison with refined nanofibers (RCNFs), lignocellulose nanofibers (LCNFs) show particular promise because it is produced from biomass using only mild pretreatment. The mechanical properties of LCNFs depend on the contained lignin. However, the microscopic location of the lignin contained in LCNFs has not been determined. Thus, we developed two methods to detect and visualize lignin. One uses a scanning transmission electron microscope (STEM) equipped with an energy dispersive X-ray spectroscopy detector. The other method uses an atomic force microscope (AFM) equipped with a cantilever coated with an aromatic molecule. Both methods revealed that the lignin in LCNFs covers a thin cellulose fiber and is precipitated in a grained structure. In particular, the AFM system was able to determine the nanoscopic location of lignin-rich areas. The present study establishes a strong tool for analyzing the characteristics of lignin-containing materials.Graphical abstract

Targeted delivery of oxaliplatin via folate-decorated niosomal nanoparticles potentiates resistance reversion of colon cancer cells

BackgroundColorectal cancer (CRC) is a prevalent type of cancer, ranking third in incidence and fourth in cancer-related deaths globally. The increase in mortality rates related to colorectal cancer among younger patients is a cause for concern. Chemotherapy is the primary approach for palliative care in colon cancer, but the development of drug resistance limits its effectiveness. Apoptosis is a process of programmed cell death that plays a crucial role in regulating normal cell death and abnormal tissue degeneration in cancer. Genes such as caspase-3, caspase-9, p53, and survivin are involved in apoptosis induction. The field of nanotechnology has presented exciting opportunities for controlled drug delivery and addressing drug resistance in cancer. Niosomes are among the nanocarriers known for their impressive features, making them excellent candidates for drug delivery. In the current study, we investigate whether niosomal nanoparticles coated with FA have the ability to deliver oxaliplatin to drug-resistant cells effectively and potentially resistance reversion in colon cancer cells. MethodsThe niosomal nanoparticles (NPs) were fabricated using the thin-film hydration method and characterized using DLS (Dynamic Light Scattering), FTIR (Fourier Transform Infrared Spectroscopy), SEM (Scanning Electron Microscopy), and AFM (Atomic Force Microscopy) systems. The drug release and drug encapsulation efficiency of the NPs were also determined. An MTT assay was performed on oxaliplatin-resistant cells to determine the IC50 values of the drug in its pure and nano-encapsulated forms. Gene expression of caspase-3, caspase-9, p53, and survivin was investigated using the qRT-PCR (quantitative Reverse Transcription Polymerase Chain Reaction) technique, and cell apoptosis or necrosis was quantified using flow cytometry. ResultsSize, PDI, zeta potential, morphology, drug release, and encapsulation efficiency of fabricated niosomal NPs were acceptable. Oxaliplatin anti-cancer drug showed a higher impact on cancerous cells in nano-encapsulated form. The expression level of caspase-3, caspase-9, and p53 was increased which was in confirmation by flow cytometry results. ConclusionTaken together, results of this study demonstrated potential effect of folate decorated oxaliplatin-loaded niosomal NPs to resistance-reversion of Oxaliplatin-resistance colon cancer cells.

A novel approach to measuring local mechanical properties via photothermal excitation of an atomic force microscope probe using an optical pump–probe inspired design

Obtaining and improving measurements of mechanical properties at the nanoscale has been made possible through the continuous advancement of atomic force microscopy (AFM) techniques over the past several decades. Among these advancements include implementing multifunctional AFM probes and developing new detection schemes that enable sensitivity to local mechanical properties. In this work, we demonstrate a proof-of-concept for a detection scheme that enables a standard AFM configuration to produce qualitative local mechanical property maps through the use of an optical pump–probe scheme, alleviating a common requirement of incorporating additional piezoelectric actuators. Data from this work are presented for silicon carbide and epitaxially grown graphene on silicon carbide. Through preliminary analysis of resonant frequency maps acquired through dual-frequency resonance tracking, the local stiffness and elastic modulus can be estimated at each point. This work contributes to the field of scanning probe microscopy by providing a new opportunity for AFM systems that are not currently equipped for a mechanical mode to obtain local mechanical property data.

Operando Nanomechanical Mapping of Silicon Thin Film Electrode during the First Lithiation and Delithiation Investigated By Bimodal Atomic Force Microscopy

Si is emerging as one of the most prospective anode materials for all-solid-state Li-ion batteries due to its extremely high theoretical capacity density of 4200 mAh g-1 and relatively negative potential for lithiation/delithiation. Towards its widespread use, controlling severe volume expansion/contraction during lithiation/delithiation is a challenge because it may cause cracking, fracture, and pulverization that negatively influence the cycle performance and rate capability of the cells [1]. Such mechanical event is induced by the change in the lattice structure due to the formation of LixSi and successive increasing/decreasing of Li content x in LixSi [2].Bimodal atomic force microscopy (AFM) offers quantitative mapping of nanoscale mechanical property, simultaneously with surface topography imaging [3]. Our group previously applied this technique to the cross-section of a composite electrode consist of active materials, binders, conductive additives, and deposited electrolyte solution and successfully demonstrated nanomechanical mapping [4]. Here, we develop an operando bimodal AFM system to track Young’s modulus changes of electrode materials in an all-solid-state battery configuration during the lithiation and delithiation reactions in real-time.A cell in a Cu/Si/LLZT/In/Li configuration was fabricated as follows; a 3 µm-thick Si thin-film and a 100 nm-thick Cu layer were sputter-deposited on one side of Li6.6La3Zr1.6Ta0.4O12 (LLZT) solid electrolyte, an In layer was sputter-deposited on the other side of LLZT, the Cu/Si/LLZT/In sample was milled with an Ar-ion beam to yield a flat and smooth cross-section suitable for AFM analysis, and then a 50 µm-thick Li metal foil was combined with the pre-coated In thin layer. Operando nanomechanical mapping was performed by mounting the cross-section-exposed cell in the custom-made sample holder coupled with a potentiostat for bias applications, in an Ar-filled glove box to prevent any atmospheric influences.Electrochemical lithiation and delithiation were carried out within a potential window of 0.01-1.20 V vs. Li/Li+. Electrochemical characterization indicated that the capacities of the Si electrode for the first lithiation and delithiation are 3300 and 1833 mAh g-1, respectively. These capacities are equal to the formation of Li3.46Si after the first lithiation of the pristine Si and Li1.54Si after the successive delithiation from Li3.46Si. Throughout the lithiation, the averaged Young’s modulus of Si electrode decreased due to the formation of LixSi and increase in the Li content x in LixSi. In the initial stage of lithiation, it drastically decreased because LixSi was formed by the lithiation of pristine Si. Then, it moderately decreased with increasing Li content x in LixSi. Unfortunately, the Young’s modulus maps were only recorded until the formation of Li1.54Si because the successive delithiation was not completed possibly due to the phase transformation of crystalline LixSi to amorphous LixSi [5], which may cause a significant mechanical strain inside the thin film. The measured Young’s modulus values were consistent with those obtained by first principle calculation [6]. Further details are given at the presentation.

Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles

Atomic force microscopy (AFM) is nowadays indispensable versatile scanning probe method widely employed for fundamental and applied research in physics, chemistry, biology as well as industrial metrology. Conventional AFM systems can operate in various environments such as ultra-high vacuum, electrolyte solutions, or controlled gas atmosphere. Measurements in ambient air are prevalent due to their technical simplicity; however, there are drawbacks such as formation of water meniscus that greatly increases attractive interaction (adhesion) between the tip and the sample, reduced spatial resolution, and too strong interactions leading to tip and/or sample modifications. Here we show how the attractive forces in AFM under ambient conditions can be used with advantage to probe surface properties in a very sensitive way even on highly mobile molecules and nanoparticles. We introduce a stable non-contact non-resonant (NCNR) AFM method which enables to reliably perform measurements in the attractive force regime even in air by controlling the tip position in the intimate surface vicinity without touching it. We demonstrate proof-of-concept results on helicene-based macrocycles, DNA on mica, and nanodiamonds on SiO2. We compare the results with other conventional AFM regimes, showing NCNR advantages such as higher spatial resolution, reduced tip contamination, and negligible sample modification. We analyze principle physical and chemical mechanisms influencing the measurements, discuss issues of stability and various possible method implementations. We explain how the NCNR method can be applied in any AFM system by a mere software modification. The method thus opens a new research field for measurements of highly sensitive and mobile nanoscale objects under air and other environments.

Periodic-Disturbance Observer Using Spectrum-Selection Filtering Scheme for Cross-Coupling Suppression in Atomic Force Microscopy

Repetitive disturbances exist widely within the automation systems, which is one of the major issues that hinder the achievement of precision operations. Dedicated to mitigating these disturbances, a generalized periodic-disturbance observer (PDOB) using spectrum-selection filtering scheme is proposed in this paper with an application to a non-minimum phase system. The design process of the spectrum-selection filter that derives from the comb-like notch filter for the proposed PDOB is presented in detail. The variants of the proposed PDOB are also presented for the disturbances distributed only in odd-and even-harmonics. To achieve tracking of the desired trajectories, the proposed PDOB is combined in parallel with a baseline Proportional-Integral (PI) controller. The stability condition of the closed-loop system is derived to provide criteria for parameters selection. The experimental validation of the generalized PI+PDOB is conducted via real-time cross-coupling suppression in raster scanning of atomic force microscope (AFM), where the coupling induced root-mean-square tracking errors are reduced from 141.8 <inline-formula> <tex-math notation="LaTeX">$nm$</tex-math> </inline-formula> to 2.4 <inline-formula> <tex-math notation="LaTeX">$nm$</tex-math> </inline-formula> by employing the proposed PDOB for the scanning rate of 100 Hz. The results of convergence testing, raster scanning and AFM imaging are compared to illustrate the significant improvements achieved with the proposed PDOB. In addition, experimental results show that the tracking performance using PI+PDOB in the case of existing periodic disturbances resembles with that using PI control without periodic disturbances, which implies that the employment of the proposed PDOB does not interfere with the tracking-based control schemes for staircase trajectories, showing the advantages of the proposed PDOB. <i>Note to Practitioners</i>&#x2014;Repetitive motions facilitate diverse advanced functions within the automation systems, including the scanning electron microscope, atomic force microscope, manipulators, and robotic systems. These operations would unavoidably introduce repetitive disturbances, hindering its achievable precision. One particular issue is the widely existent cross-coupling effect that results in these repetitive disturbances. In this paper, a generalized periodic-disturbance observer (PDOB) based on the spectrum-selection filtering scheme is developed to address the repetitive disturbances for real-time coupling suppression in raster scanning of Atomic Force Microscopy. Consequently, the offline learning procedures required for other learning based schemes can be avoided. Without loss of generalization, the design of PDOB is demonstrated with an application to non-minimum phase systems. A scheme of the varying parameter is also developed to achieve both fast convergence and better performance at rejecting the periodic disturbances. The detailed variations to handle the disturbances distributed only in odd-and even-harmonics are also demonstrated. Different from other disturbance observers, the inclusion of the spectrum-selection filtering scheme provides more flexibility in rejecting specific repetitive disturbances. In terms of tracking accuracy and the simple structure, this development can also be easily implemented to other systems that suffer from repetitive disturbances.

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection.

An Atomic Force Microscope(AFM) isa powerful and versatile tool for nanoscale surface studies to capture 3D topography images of samples. However, due to their limited imaging throughput, AFMs have not been widely adopted for large-scale inspection purposes. Researchers have developed high-speed AFM systems to record dynamic process videos in chemical and biological reactions at tens of frames per second, at the cost of a small imaging area of up to several square micrometers. In contrast, inspecting large-scale nanofabricated structures, such as semiconductor wafers, requires nanoscale spatial resolution imaging of a static sample over hundreds of square centimeters with high productivity. Conventional AFMs use a single passive cantilever probe with an optical beam deflection system, which can only collect one pixel at a time during AFM imaging, resulting in low imaging throughput. This work utilizes an array of active cantilevers with embedded piezoresistive sensors and thermomechanical actuators, which allows simultaneous multi-cantilever operation in parallel operation for increased imaging throughput. When combined with large-range nano-positioners and proper control algorithms, each cantilever can be individually controlled to capture multiple AFM images. With data-driven post-processing algorithms, the images can be stitched together, and defect detection can be performed by comparing them to the desired geometry. This paper introduces principles of the custom AFM using the active cantilever arrays, followed by a discussion on practical experiment considerations for inspection applications. Selected example images of silicon calibration grating, highly-oriented pyrolytic graphite, and extreme ultraviolet lithography masks are captured using an array of four active cantilevers ("Quattro") with a 125 µm tip separation distance. With more engineering integration, this high-throughput, large-scale imaging tool can provide 3D metrological data for extreme ultraviolet (EUV) masks, chemical mechanical planarization (CMP) inspection, failure analysis, displays, thin-film step measurements, roughness measurement dies, and laser-engraved dry gas seal grooves.

Atomic force microscopy as a tool for mechanical characterization at the nanometer scale

The design, optimization and realization of innovative nanocomposite materials for advanced applications in a broad range of fields, from energy, automotives and photonics to biology and nanomedicine, require the capability to characterize their physical properties (e.g. mechanical, electric and magnetic) from a multiscale perspective, in particular not only at the macroscopic scale but also at the nanometer one. In particular, methods are needed to characterize mechanical properties at a nanometer lateral resolution, in order to understand the contribution of the nanosized features of the materials and related phenomena. Atomic force microscopy (AFM) has evolved from a tool for the morphological analysis of the sample surface to an integrated platform for the physicochemical characterization of samples. Current AFM systems host several advanced techniques for the mechanical characterization of materials at a high speed and a high lateral resolution in a broad range of mechanical moduli – for example, from stiff samples (e.g. coatings and crystals) to soft materials (e.g. polymers and biological samples) – in different environments (e.g. air, vacuum and liquid) and conditions (controlled humidity and controlled temperature). Here, a short review of AFM-based methods for the nanomechanical characterization of materials, in particular, force spectroscopy, is reported with the emphasis on materials that can be analyzed.

The Development of 3D Atomic Force Microscopy with Magnetically Driven-Orthogonal Cantilever Probes

This paper presents a three-dimensional (3D)-atomic force microscopy (AFM) method based on magnetically driven (MD)-orthogonal cantilever probes (OCPs), in which two independent scanners with three degrees of freedom are used to achieve the vector tracking of a sample surface with a controllable angle. A rotating stage is integrated into the compact AFM system, which helps to achieve 360° omnidirectional imaging. The specially designed MD-OCP includes a horizontal cantilever, a vertical cantilever, and a magnetic bead that can be used for the mechanical drive in a magnetic field. The vertical cantilever, which has a protruding tip, can detect deep grooves and undercut structures. The design, simulation, fabrication, and performance analysis of the MD-OCP are described first. Then, the amplitude compensation and home positioning for 360° rotation are introduced. A comparative experiment using an AFM step grating verifies the ability of the proposed method to characterize steep sidewalls and corner details, with a 3D topography reconstruction method being used to integrate the images. The effectiveness of the proposed 3D-AFM based on the MD-OCP is further confirmed by the 3D characterization of a micro-electromechanical system (MEMS) device with microcomb structures. Finally, this technique is applied to determine the critical dimensions (CDs) of a microarray chip. The experimental results regarding the CD parameters show that, in comparison with 2D technology, from which it is difficult to obtain sidewall information, the proposed method can obtain CD information for 3D structures with high precision and thus has excellent potential for 3D micro–nano manufacturing inspection.

Large Range Atomic Force Microscopy with High Aspect Ratio Micropipette Probe for Deep Trench Imaging.

Atomic force microscopy (AFM) has been adopted in both industry and academia for high-fidelity, full-profile topographic characterization. Typically, the tiny tip of the cantilever and the limited traveling range of the scanner restrict AFM measurement to relatively flat samples (recommend 1µm). The primary objective of this work is to address these limitations using a large-range AFM (measuring height >10µm) system consisting of a novel repairable high aspect ratio probe (HARP) with a nested-proportional-integral-derivative (nested-PID) AFM system. The HARP is fabricated using a reliable, cost-efficient bench-top process. The tip is then fused by pulling the end of the micropipette cantilever with a length up to hundreds of micrometers and a tip diameter of 30nm. The design, simulation, fabrication, and performance of the HARP are described herein. This instrument is then tested using polymer trenches which reveals superior image fidelity compared to standard silicon tips. Finally, a nested-PID system is developed and employed to facilitate 3D characterization of 50-µm-step samples. The results demonstrate the efficacy of the proposed bench-top technique for the fabrication of low-cost, simple HAR AFM probes that facilitate the imaging of samples with deep trenches.

Investigating the activation of passive metals by a combined in-situ AFM and Raman spectroscopy system: a focus on titanium

Understanding the main steps involved in the activation of passive metals is an extremely important subject in the mechanical and energy industry and generally in surface science. The titanium-H2SO4 system is particularly useful for this purpose, as the metal can either passivate or corrode depending on potential. Although several studies tried to hypothesise the surface state of the electrode, there is no general consensus about the surface state of Ti in the active–passive transition region. Here by combining in-situ atomic force microscopy (AFM) and Raman spectroscopy, operating in an electrochemical cell, we show that the cathodic electrification of Ti electrodes causes the dissolution of the upper TiO2 portion of the passive film leaving the electrode covered by only a thin layer of titanium monoxide. Fast anodic reactions involved the acidification of the solution and accumulation of sulphur containing anions. This produces a local increase of the solution turbidity, allowing to distinguish favourable regions for the precipitation of TiOSO4·2H2O. These results give a clear answer to the long-stated question of the physical origin behind the formation of negative polarization resistances, sometimes occurring in corroding systems, and a rationale about the proton-induced degradation of passive surfaces in presence of sulphur containing species.

Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating

The calibration of the non-orthogonal error in nanoscale measurements is of paramount importance for analytical measuring instruments. Particularly, the calibration of non-orthogonal errors in atomic force microscopy (AFM) is essential for the traceable measurements of novel materials and two-dimensional (2D) crystals. The 2D self-traceable grating with a theoretical non-orthogonal angle of less than 0.0027° and an expanded uncertainty of 0.003° (k = 2) are measured by the Metrological Large Range Scanning Probe Microscope (Met. LR-SPM). In this study, we characterized the local and overall non-orthogonal error in AFM scans and proposed a protocol to tune the optimal scanning parameters of AFM minimizing the non-orthogonal error. We presented the method for accurately calibrating a commercial AFM system for non-orthogonal by establishing a detailed uncertainty budget and errors analysis. Our results verified the important advantages of the 2D self-traceable grating in calibrating precision instruments.

Preparation and characterization of tin chloride-based polymeric composite for gamma shielding applications

Thin films of Poly (ethylene-co-vinyl acetate)/tin chloride different weight (w/w) ratios were prepared using a spin-coating method. The diameter, height, grain size, and other morphological and structural features of the prepared thin films were studied using atomic force microscope (AFM) system. Moreover, the maximum surface roughness and average diameter of the prepared thin films were reported to weight ratio of 0.3%Sn Also, the shielding properties of adding tin chloride inside the polymer matrix were investigated. In addition, the impact of adding the tin-dopant to the targeted polymer on the attenuation parameters, including the linear attenuation coefficient (μ), half-value layer (HVL), screening ratios, and the mean free path, were theoretically calculated. The results show that the properties of the prepared thin films can be improved significantly by introducing a small amount of tin chloride to the host polymer promoting the crystallinity of the produced material and enhancing the shielding property for gamma-rays. The better linear attenuation coefficient of the produced thin films was reported to the weight ratio of 0.3% Sn. The produced Poly (ethylene-co-vinyl acetate)/tin chloride thin films can be suggested as one of the significant shielding materials to be used in a wide range of applications in the field of radiation.