Gas chromatography/electron-capture negative ionization mass spectrometry (GC/ECNI-MS) was used to separate and detect a mixture of 24, 3-and 4-methyl sulfone-substituted polychlorinated biphenyls (MeSO2-PCBs). The dominant fragment ions were [M-CH3]- and [M-Cl+H]-, and to a lesser extent [M-2Cl]-, [M-2Cl+2H]-, [M-CH3-Cl+H]- and [M-SO2CH3+H]-). The structures of the 3-and 4-MeSO2-PCBs varied in the degree (i.e. tetrachloro-to heptachloro-) and position of chlorine substitution. With the assistance of multivariate statistical analysis, the abundance of several isotopic clusters of fragment ions relative to that of the molecular ion (M-) was found to vary as a function of MeSO2-PCB structure. Compared with other congeners, the relative abundance of [M-CH3]- was significantly lower for MeSO2-PCBs containing the 4-MeSO2-2,5-dichloro moiety, and the hexachloro-and heptachloro-MeSO2-PCBs had higher relative abundances of [M-Cl+H]-. Subtle ECNI mass spectral fragmentation rules therefore exist for 3-and 4-MeSO2-PCBs with respect to congener structure; however, both ion source temperature and pressure must be controlled. Increasing the ion source temperature from 100 to 260°C resulted in an large increase in the abundance of [M-CH3]- relative to M- from <20% to >100%, for all the MeSO2-PCBs studied. For the set of ten 3-/4-MeSO2-PCB pairs, the [M-CH3]- relative abundance ratio was independent of ion source temperature, and was ∽4.5 and ∽1.5 for congeners possessing 2,5-dichloro and 2,5,6-trichloro substitution on the MeSO2-containing phenyl ring, respectively. The effect of an increase in ion source temperature, over the same temperature range, on the relative abundance of hydrogen inclusion-type fragment ions was much less dramatic. [M-CH3-Cl+H]- and [M-Cl+H]- abundance often increased, but never exceeded ∽40%. Decreasing the methane reagent gas pressure from 0.5 to 0.05 mbar did not significantly alter the ion source temperature effect on the relative abundance of the fragment ions. However, the ECNI response sensitivity decreased by an order of magnitude. © 1997 by John Wiley & Sons, Ltd.
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