We demonstrate, to our knowledge, a novel monolithic platform for photonic integrated circuits (PICs) based on amorphous-Ge2Sb2Se4Te (am-GSST). Additionally, we explore the concept of mode symmetrization using the epsilon-near-zero behavior displayed by indium-tin-oxide (ITO) to achieve a substrate with n=1 at 1550 nm, the same as the air cladding. We designed, fabricated, and characterized various on-chip components using this platform, including waveguides with preliminary 5.57±0.365dB/mm propagation loss. Furthermore, we propose a post-fabrication tuning of the refractive index by using the phase change nature of GSST to crystallize local sections of the waveguides using electron beams. Our substrate-blind approach is a versatile platform for post-fabrication tunable PICs that could benefit intricate on-chip nanophotonic structures requiring enhanced and symmetric mode confinement.