Control charts are customarily developed under the assumption of normal quality characteristics to be monitored. However, in many real dataset applications, the normality assumption is not easy to hold. The in-control (IC) robustness of the charting schemes has significant importance for the valid out-of-control (OOC) performance. This article intends to investigate the IC robustness of the unbiased-function-based adaptive cumulative sum (ACUSUM) chart and nonparametric ACUSUM (NPACUSUM) chart against the non-normal process distributions including symmetrical, skewed, and contaminated normal distributions. The OOC run length profiles of the ACUSUM and the proposed NPACUSUM charts for the individual measurements against the non-normal distributions are also a part of this study. The run length profiles of the proposed charting schemes have been computed using the Monte Carlo simulation method. The artificial datasets have been taken from some symmetric and skewed distributions to implement the proposals. An electrical engineering dataset has also been taken for the implementation of the proposal on a real dataset.
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