Action Of Electromagnetic Pulses Research Articles

Effect of the Electromagnetic Susceptibility of Metal Interconnects: A Simulation Study

Large induced electromotive force will be generated on the metal interconnections under the action of strong electromagnetic pulse, thereby generating a large induced current. For copper metal interconnects commonly used in modern integrated circuits, large currents will cause electromigration, resulting in short or open in the circuit, causing damage to devices and circuits. In order to study the damage of metal interconnects under the action of electromagnetic pulse, in this paper, the induced electromotive force of metal interconnects under the action of HPM is derived through theoretical analysis, then analyzing the influence of different electromagnetic pulse parameters on the induced electromotive force of interconnects by the use of electromagnetic simulation software COMSOL. Using the established metal interconnect model, the electromagnetic sensitivity effect of metal interconnect is studied by analyzing the electric field distribution, current density and temperature distribution on the interconnect under electromagnetic pulse.

Research on Analysis and Classification of Vulnerability of Electromagnetic Pulse with a STM32 Single-Chip Microcomputer

With the continuous development of information technology, the performance of the entire traditional electrical system is gradually optimized. Nowadays, the single-chip technology is an important part of the traditional electrical system because it determines the operating quality of the entire traditional system. However, due to the electromagnetic pulse, the single-chip microcomputer system may be interfered with malfunction or damage, which seriously affects its performance. Therefore, to investigate the impact of an electromagnetic pulse on a single-chip microcomputer system, in this research work, we have used a STM32 single-chip microcomputer as the research object by setting up multiple sets of STM32 single-chip microcomputer serial communication systems. Besides, we have conducted an electromagnetic pulse vulnerability experiment using the inductive coupling inject method which has improved the antielectromagnetic pulse capacity of the STM32 single-chip serial communication system. The experimental results show that the damage threshold of the single-chip microcomputer with positive pulse injection is greater than the negative pulse injection, which indicates that the serial communication system of the STM32 single-chip microcomputer is more sensitive to the negative pulse injection. Moreover, this research work is of great significance to evaluate more accurately the viability and anti-interference capability of a single-chip microcomputer system under the action of electromagnetic pulse.

Mathematical modeling and study of thermoelastic behavior of a bimetallic layer with plane-parallel boundaries under the action of electromagnetic pulses

The dynamic problem of thermomechanics for a bimetallic layer with plane-parallel boundaries under the action of a homogeneous nonstationary electromagnetic field has been formulated. The thermal stress state, the bearing capacity, and the contact properties of the considered layer under the action of electromagnetic pulses of microsecond duration are numerically analyzed.

The spectroscopic correspondence principle for the time evolution of quantum transitions under the action of electromagnetic pulses

This work is dedicated to the generalization of the spectroscopic correspondence principle to the time dependence of the evolution of a dipole-allowed quantum transition in a two-level system (TLS) under the action of an electromagnetic pulse (EMP). The formulas for the time dependence of the absorbed EMP energy for excitation of a classical oscillator and an oscillator of a transition in a TLS are derived within the framework of the first order of perturbation theory. It is shown that in the case of zero width of a transition line (or in case of zero damping constant γ for a classical oscillator) classical and quantum approaches give the same results for arbitrary EMP parameters (duration and carrier frequency). A noticeable distinction between the time dependences of the absorbed energy for a classical oscillator and a quantum TLS with a Lorentz spectral profile is observed for sufficiently long pulses.

Dynamic thermoelastic processes in a conductive plate under the action of electromagnetic pulses of microsecond and nanosecond durations

In this article, on the basis of the developed by the authors version of the theory of thermomechanics of nonferromagnetic conductive bodies under the action of pulsed electromagnetic fields, a dynamic boundary-value problem of thermomechanics for a conducting nonferromagnetic plate taking into account adiabatic nature of the process of its heating and deformation by the pulsed electromagnetic field is formulated. The solutions of the problem for the action of electromagnetic pulse are obtained. The laws of changes of the electromagnetic field in time, Jouly heat, ponderomotive forces, temperature, and stresses under the action of electromagnetic pulses of microsecond and nanosecond durations are numerically investigated.

Study on Insulation Breakdown Characteristics of Printed Circuit Board under Continuous Square Impulse Voltage

The widely distributed interconnects in printed circuit boards (PCBs) easily couple with high voltage under the action of electromagnetic pulses, which leads to insulation failure. In this study, the dielectric breakdown characteristics of four typical PCBs are studied under continuous square impulse voltage conditions. First, the electric field distribution in the four electrode models is simulated with the ANSYS software (ANSYS Maxwell 17.0). Electric field simulation results show the weak area of electric field distribution. On this basis, the possible breakdown patterns of PCB are analyzed. Second, the influence of factors, such as temperature, pulse duty ratio, interconnect insulation distance, and air pressure, on PCB breakdown voltage is studied through a breakdown test on the PCBs. Results show that the discharge between the single-layer electrodes of the PCBs is surface discharge, and the breakdown is that of a “gas–solid composite medium”. Meanwhile, the breakdown of a double-layer PCB is solid breakdown. Finally, scanning electron microscopy (SEM) produced by Tescan (Brno, Czech Republic) is performed to study the carbonization channel after PCB breakdown. SEM results reveal that the PCB carbonization channel is influenced by temperature and pressure in varying degrees.

Bearing ability of conducting elements of the canonical shape under the action of electromagnetic pulses

A procedure is proposed for the prediction of the bearing ability of conducting structural elements under the action of electromagnetic pulses. For bodies of canonical shapes, i.e., plates and hollow and solid cylinders or spheres, the initial-boundary-value problems are formulated for the evaluation of the parameters of electromagnetic fields, temperature, and the components of the tensor of dynamic stresses. We construct the dependences of the maximum values of stress intensities in these nonferromagnetic bodies on the time parameters of electromagnetic pulses and the maximum magnetic-field intensity on the surfaces of the bodies. These dependences are then used to determine the critical values of the analyzed quantities corresponding to the loss of the bearing ability of the body.

Thermal stressed state of a conducting ball under the action of pulsed electromagnetic fields

We pose the dynamic centrally symmetric problem of thermomechanics for a continuous conducting ball subjected to the nonstationary uniform electromagnetic action and propose a method for its solution based on the use of the cubic approximation of the azimuthal component of the magnetic vector and the radial component of the stress tensor in the radial coordinate. The solution of the problem is obtained and the thermal stressed state of the ball under the action of electromagnetic pulses is numerically investigated.

Thermal Stressed State of a Conducting Plate under the Action of Electromagnetic Pulses

We give the mathematical formulation of a dynamic boundary-value problem of electromagnetothermoelasticity for a conducting nonferromagnetic plate subjected to adiabatic deformation by a pulsed electromagnetic field. We find exact and approximate solutions of model problems for magnetic impacts with finite velocity or under the action of electromagnetic pulses and study the limits of applicability of polynomial approximations for the unknown functions across the thickness of the plate used for the determination of approximate solutions of the considered problems.

Transportable simulators of electromagnetic pulses based on magnetocumulative generators

Transportable simulators of electromagnetic pulses that can be delivered directly to the locations of tested objects are designed for tests of the resistance of various wide-scale objects to the action of electromagnetic pulses. Explosive magnetocumulative generators are used as the power sources. The tested objects are protected from the effects of explosion of the generators by simple protective facilities. Experiments on the production of pulsed magnetic fields in volumes of up to100 m 3 were performed. A current-pulse shaping scheme was used to generate a rapidly increasing field. Plane electromagnetic waves were produced, by means of an air-strip line powered from the generators. The action of electromagnetic pulses on buried cable lines was modeled. Test specimens of simulators of the action of electromagnetic pulses and lightning current are produced.