Accredited Standards Committee C63 Research Articles

C63® gives wireless workshop in New Orleans

The American National Standards Institute Accredited Standards Committee C63® (EMC) took its continuing major annual workshops this time to the Bayou. This workshop, which was focused on compliance testing of wireless devices, licensed and unlicensed, was held on July 20. This was the Saturday before the start of the 2019 IEEE International Symposium on EMC+SIPI held in New Orleans, Louisiana. The ANSI C63 standards specifically addressed in the workshop included: • C63.10 "American National Standard for testing unlicensed wireless devices" covering measurements of emissions from such transmitters • C63.26 "American National Standard of procedures for compliance testing of transmitters used in licensed radio services" covering measurement of emissions from these transmitters.

Estimating the Likelihood of Wireless Coexistence Using Logistic Regression: Emphasis on Medical Devices.

Medical device manufacturers incorporate wireless technology in their designs to offer convenience and agility to both patients and caregivers. However, the use of unlicensed radio spectrum bands by both medical devices and other equipment raises concerns about wireless coexistence. Work by the accredited standards committee C63 of the American National Standards Institute (ANSI) to provide the community with a consensus standard for coexistence evaluation resulted in the publication of the ANSI C63.27 standard, which was later recognized by the U.S. Food and Drug Administration. Estimating the likelihood of wireless coexistence of a system under test (SUT) in a given environment is central to the evaluation and reporting of wireless coexistence, as made clear in the C63.27 standard. However, no method to perform this estimation is provided. In this paper, we propose the use of logistic regression (LR) to estimate the likelihood of wireless coexistence of a medical device in its intended environment. Radiated open environment coexistence testing was used to realize a test scenario in which the interfering network was IEEE 802.11n Wi-Fi and the SUT was ZigBee; exemplary wireless technologies for interfering network and medical device, respectively. LR model fitting was then performed to derive a model that describes the performance of SUT under a range of wireless coexistence phenomena. Finally, results were incorporated with the outcome of a spectrum survey using Monte Carlo simulation to estimate the SUT likelihood of wireless coexistence in a hospital environment.

Accredited standards committee C63® on EMC meets at the IEEE service center in New Jersey, USA

For this edition of the EMC Magazine we thought it would be interesting to capture some of the major activities discussed at the ANSI C63 meetings last May in Piscataway, New Jersey at the IEEE Service Center. The meetings themselves spanned five days with the parent committee meeting the last day to hear reports from its six subcommittees.

C63® gives a wireless workshop in long beach

The American National Standards Institute Accredited Standards Committee C63® (EMC) took its continuing major annual workshops this time to the West Coast of the US. This one, which was focused on compliance testing of wireless devices and unintentional radiators, was held on 28 July 2018, the Saturday before the start of the Long Beach EMC Society Symposium. The host was Element Materials Technology in Irvine, California. Their semi-anechoic chamber was made available to perform testing of transmitters in accordance with the following standards:

C63 visits the harbor

The American National Standards Institute (ANSI) Accredited Standards Committee C63® (EMC) took its show on the road again and ended up in National Harbor, Maryland, just south of Washington DC. This time there were two half-day workshops on August 5, 2017 held at the site of the annual IEEE Symposium on EMC, Power Integrity and Signal Integrity (EMC+SIPI) - the convention center of the Gaylord hotel. The symposium was held over August 7-11 and so as usual the workshop preceded the start of the symposium.

EMC standards activity

The American National Standards Institute (ANSI) Accredited Standards Committee C63® (EMC) took its show on the road again and ended up in Ottawa, Canada at the Flextronics Design Validation Centre the weekend before the IEEE EMC Symposium in Ottawa which took place over 25-29 July 2016.

C63 goes to Shenzhen, China!

The American National Standards Institute (ANSI) Accredited Standards Committee (ASC) C63 (EMC) took its show on the road again and ended up in May at the BV 7layers test lab in Shenzhen, China - the location of the APEMC 2016 symposium. The workshops covered the ANSI ASC C63 flagship incidental emission measurement standard, C63.4, and its rapidly maturing draft on time domain site validation measurements, C63.25. The workshops were held on Tuesday, 17 May, before the start of the APEMC 2016 symposium which was held on Wednesday through Saturday, 18-21 May 2016. That venue was the Shenzhen Convention and Exhibition Center (SZCEC).

What do transmitters and measurement uncertainty have in common?

That question was answered in Denver just before the start of the IEEE EMC Symposium week by ANSI Accredited Standards Committee C63® holding its annual workshop series. This year the topics were quite different from those in the past years. Specifically, this year two standards recently published were woven into Friday and Saturday workshops at the symposium host hotel. The standards included:

ASC C63® continues workshops before annual symposia

The Accredited Standards Committee C63® continued the tradition of holding workshops the weekend before the start of our IEEE EMC Society symposia - in this case the workshops were held in Pittsburgh.