Analysis Of Accelerated Life Test Data Research Articles

Research on lifetime distribution and reliability of IGBT module based on accelerated life test and K-S test

To realise lifetime distribution and reliability analysis of IGBT, a new research method for IGBT module lifetime was proposed based on double stress accelerated life test and K-S test. In this method, the lifetime of IGBT module was assumed to be logarithmic normal distribution. Then the K-S test was used to test the distribution of the logarithmic normal and Weibull on a set of the junction temperature and vibration double stress constant stress accelerated life test data of IGBT module for electric vehicle. And another set of IGBT accelerated life data was simulated and analysed by using the accelerated life test data analysis software. The results show that the lifetime of IGBT modules under ALTA accelerated life simulation is still confirmed to the lognormal distribution, which further validates the correctness of the proposed assumption. This method has certain guiding significance to the life distribution and reliability analysis of IGBT module.

Accelerated Life Test Data Analysis for Repairable Systems

In this article, the imperfect maintenance model and proportional intensity model are used to analyze failure data of repairable systems in accelerated life testing. In the design and development phase of products, we should collect and analyze failure data quickly with small proto-type products. Thus, we test the products under accelerated conditions and if the products fail, then we repair and use those continuously in the life testing. Acceleration and repair models are needed to analyze the failure data. An age reduction model (Brown et al.'s Brown et al. 1983, model) and relationship between scale parameter and stress level are assumed. The stress acts multiplicatively on the baseline cumulative intensity. The maximum likelihood method is used, the log-likelihood function is derived, and a maximizing procedure is proposed. In simulation studies, we investigate the accuracy and trends of the maximum likelihood estimator.

Accelerated life test data analysis with generalised life distribution function and with no aging model assumption

The purpose of this paper is to present a method of statistical analysis of Accelerated Life Test (ALT) data which allows to drop assumptions usually made on the type of life distribution function at each stress level and the life-stress relationship. The method proposed can be used to derive life distribution function for nominal stress level based on a number of accelerated non-censored tests. The method can be especially useful in a variety of areas where the assumptions on life distribution function and/or life-stress relationship is not well justified by empirical or theoretical model.