We have measured the ac complex resistivity in thelinear regime, as well as dc resistivity, for thick (100, 300 nm)amorphous (a-)MoxSi1–x films at low temperatures(T > 0.04 K) in constant fields B. The critical behaviorassociated with the second-order transition has been observedfor both dc and ac resistivities, which is similar to that observedfor granular indium films. This is the first convincing evidencefor the vortex glass transition (VGT) in the homogeneouslydisordered low-TC superconductors containing microscopicpinning centers. We have found that the VGT persists down to T ∼ 0.1TC0 up to B ∼ 0.9BC2(0), where TC0 and BC2(0) are themean-field transition temperature and upper critical field at T = 0, respectively. At T → 0 the VGT line Bg(T) extrapolatesto a field below BC2(0), indicative of the presence of a T = 0quantum-vortex-liquid phase in the region Bg(0) < B < BC2(0).For thin (4 nm) films the (T = 0) field-driven superconductor–insulator transition takes place at BC. We have notobtained evidence of the metallic quantum liquid phase below BC, while in B > BC an anomalous negative magnetoresistance(MR) suggesting the presence of the localized Cooper pairs hasbeen observed. The negative MRis commonly observed for thinfilms; however, for thick films the MR is always positive. Thismeans that the two-dimensionality plays an important role inthe appearance of the negative MR (or localized Cooper pairs).The negative MR is no longer visible as the field is appliedparallel to the film surface, consistent with the view that mobilevortices, as well as localized Cooper pairs, are present in B > BC.