Abstract

(Zn(NO2)2.6H2O) and (NaOH) are used for synthesis ZnO nanostructures by one step reaction at 80℃ . X-ray diffraction (XRD) pattern referes polycrystalline nature with a hexagonal structure. Rietveld refinement (curried out by fullprof software) of XRD patterns a provide accurate values for the lattice parameter a=3.250353 0.00009 Å , c=5.207006 0.00020Å where c/a ratio is 1.601981. The average crystalline size was calculated by Debye-Scherrer method about 30 nm. The effects of strain in X- ray line broadening of ZnO nanoparticles (NPs) were investigated by Williamson-Hall method revealed that the peak broadening is not only due to reduced coherently diffracting domain size but also due to a significant strain distribution. The extracted particle size is about 31.5 nm and internal lattice strain value was found to be 6*10-4. The morphological and topographical studies were carried out by using scanning electron microscopy SEM, the average particle size is matched with that obtained by Debye-Scherrer and Williamson-Hall methods.

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