Abstract

Zinc oxide (ZnO) thin films and micro- and nanostructures are very promising candidates for novel applications in emerging thin-film transistors, solar cells, sensors and optoelectronic devices. In this paper, a low-cost sol–gel spin coating technique was used to fabricate ZnO films on glass substrates. The sol–gel fabrication process of the ZnO films is described. The influence of precursor concentration on the material properties of the ZnO films was investigated. Atomic force microscopy and X-ray diffractometry were employed to examine the structural properties of the ZnO films. The optical properties of the ZnO films were characterized with ultraviolet–visible spectroscopy. The experimental results reveal that the precursor concentration in the sol–gel spin coating process exerts a strong influence on the properties of the ZnO films. The effects of the precursor concentration are discussed.

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